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机译:基于物理的模型从过程到器件仿真的转移:应用于高级SOI MOSFET
LAAS/CNRS, University of Toulouse, 7 av. Col. Roche, 31077 Toulouse, France STMicroelectronics, 850 rue Jean Monnet, 38926 Crolles Cedex, France CEMES/CNRS, 29 rue J. Marvig, 37055 Toulouse, France;
STMicroelectronics, 850 rue Jean Monnet, 38926 Crolles Cedex, France;
LAAS/CNRS, University of Toulouse, 7 av. Col. Roche, 31077 Toulouse, France;
LAAS/CNRS, University of Toulouse, 7 av. Col. Roche, 31077 Toulouse, France;
STMicroelectronics, 850 rue Jean Monnet, 38926 Crolles Cedex, France;
CEMES/CNRS, 29 rue J. Marvig, 37055 Toulouse, France;
Synopsys Switzerland LLC, Thurgauerstrasse 40, 8050 Zuerich, Switzerland;
Synopsys Switzerland LLC, Thurgauerstrasse 40, 8050 Zuerich, Switzerland;
LAAS/CNRS, University of Toulouse, 7 av. Col. Roche, 31077 Toulouse, France;
dopant diffusion; silicon on insulator; advanced CMOS technology; simulations; physical modelling;
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