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Effects of argon and oxygen flow rate on water vapor barrier properties of silicon oxide coatings deposited on polyethylene terephthalate by plasma enhanced chemical vapor deposition

机译:氩气和氧气流速对等离子体增强化学气相沉积法沉积在聚对苯二甲酸乙二醇酯上的氧化硅涂层的水蒸气阻隔性能的影响

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摘要

Plasma polymer coatings were deposited from hexamethyldisiloxane on polyethylene terephthalate (PET) substrates while varying the operating conditions, such as the Ar and O_2 flow rates, at a fixed radio frequency power of 300 W. The water vapor transmission rate (WVTR) of the untreated PET was 54.56 g/m~2/day and was decreased after depositing the silicon oxide (SiO_x) coatings. The minimum WVTR, 0.47 g/m~2/day, was observed at Ar and O_2 flow rates of 4 and 20 sccm, respectively, with a coating thickness of 415.44 nm. The intensity of the peaks for the Si-O-Si bending at 800-820 cm~(-1) and Si-O-Si stretching at 1000-1150 cm~(-1) varied depending on the Ar and O_2 flow rates. The contact angle of the SiO_x coated PET increased as the Ar flow rate was increased from 2 to 8 sccm at a fixed O_2 flow rate of 20 sccm. It decreased gradually as the oxygen flow rate increased from 12 to 28 sccm at a fixed Ar carrier gas flow rate. The examination by atomic force microscopy revealed a correlation of the SiO_x morphology and the water vapor barrier performance with the Ar and O_2 flow rates. The roughness of the deposited coatings increased when either the O_2 or Ar flow rate was increased.
机译:从六甲基二硅氧烷在聚对苯二甲酸乙二醇酯(PET)基板上沉积等离子聚合物涂层,同时以300 W的固定射频功率改变工作条件(例如Ar和O_2流速)。未经处理的水蒸气透过率(WVTR) PET为54.56 g / m〜2 / day,并且在沉积氧化硅(SiO_x)涂层后降低。在Ar和O_2流速分别为4和20 sccm时,观察到的最小WVTR为0.47 g / m〜2 / day,涂层厚度为415.44 nm。 Si-O-Si在800-820 cm〜(-1)弯曲和Si-O-Si在1000-1150 cm〜(-1)拉伸的峰强度随Ar和O_2的流速而变化。在20 sccm的固定O_2流量下,随着Ar流量从2 sccm增大到8 sccm,SiO_x涂层的PET的接触角增加。在固定的Ar载气流量下,随着氧气流量从12 sccm增加到28 sccm,它逐渐降低。原子力显微镜检查表明,SiO_x形态和水蒸气阻隔性能与Ar和O_2流量相关。当O_2或Ar流量增加时,沉积涂层的粗糙度增加。

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