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Transparent p diode device from a single zinc nitride sputtering target

机译:来自单个氮化锌溅射靶的透明p / n二极管器件

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摘要

Zinc oxide (ZnO) thin films showing bipolar conductivity were fabricated by sputtering of zinc nitride target in plasma containing mixture of Ar-O_2 gasses. Sputtering in pure Ar plasma produced conductive and opaque zinc nitride (ZnN) films while upon introduction of oxygen up to 30% into the plasma highly transparent single phase polycrystalline n-type ZnO films have been grown. ZnN sputtering in Ar plasma containing more than 30% oxygen produced p-type ZnO films. Hall-effect and photoluminescence measurements revealed the presence of zinc vacancies and nitrogen which are acting as acceptor dopants in p-type ZnO. A heterostructure was fabricated in a single deposition run consisting of n-ZnN and p-ZnO which exhibited rectifying behavior with 2-2.5 V turn-on voltage. Improvements on the formed p heterostructure as well as the potential of using single sputtering target in fabrication of Zn-based homo- and hetero-junctions are discussed.
机译:通过在包含Ar-O_2气体的等离子体中溅射氮化锌靶材,制备了具有双极导电性的氧化锌(ZnO)薄膜。在纯Ar等离子体中进行溅射可制得导电和不透明的氮化锌(ZnN)膜,而在将等离子中的氧含量提高到30%时,已生长出高度透明的单相多晶n型ZnO膜。在Ar等离子体中包含超过30%的氧气的ZnN溅射产生了p型ZnO膜。霍尔效应和光致发光测量表明,存在锌空位和氮,它们在p型ZnO中充当受体掺杂剂。在由n-ZnN和p-ZnO组成的单次沉积过程中制造了异质结构,该异质结构在开启电压为2-2.5 V时显示出整流行为。讨论了对形成的p / n异质结构的改进以及在制造Zn基均质和异质结中使用单个溅射靶材的潜力。

著录项

  • 来源
    《Thin Solid Films》 |2011年第4期|p.1202-1206|共5页
  • 作者单位

    Microelectronics Research Croup, Institute of Electronic Structure and Laser, Foundation for Research and Technology-FORTH-Hellas, P.O. Box 1385, Heraklion 71110, Crete, Greece;

    Microelectronics Research Croup, Institute of Electronic Structure and Laser, Foundation for Research and Technology-FORTH-Hellas, P.O. Box 1385, Heraklion 71110, Crete, Greece;

    Microelectronics Research Croup, Institute of Electronic Structure and Laser, Foundation for Research and Technology-FORTH-Hellas, P.O. Box 1385, Heraklion 71110, Crete, Greece;

    Microelectronics Research Croup, Institute of Electronic Structure and Laser, Foundation for Research and Technology-FORTH-Hellas, P.O. Box 1385, Heraklion 71110, Crete, Greece;

    Photonics Croup, Tyndall National Institute, Cork, Ireland;

    Microelectronics Research Croup, Institute of Electronic Structure and Laser, Foundation for Research and Technology-FORTH-Hellas, P.O. Box 1385, Heraklion 71110, Crete, Greece;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    sputtering; zinc nitride; zinc oxide; transparent diode; p-Type ZnO;

    机译:溅射氮化锌氧化锌透明二极管p型ZnO;

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