机译:金刚石晶粒尺寸对纳米晶金刚石薄膜探测器电学性能的影响
School of Materials Science and Engineering, Shanghai University, Shanghai 200072, People's Republic of China;
School of Materials Science and Engineering, Shanghai University, Shanghai 200072, People's Republic of China;
School of Materials Science and Engineering, Shanghai University, Shanghai 200072, People's Republic of China;
School of Materials Science and Engineering, Shanghai University, Shanghai 200072, People's Republic of China;
School of Materials Science and Engineering, Shanghai University, Shanghai 200072, People's Republic of China;
School of Materials Science and Engineering, Shanghai University, Shanghai 200072, People's Republic of China;
School of Materials Science and Engineering, Shanghai University, Shanghai 200072, People's Republic of China;
nano-crystalline diamond film; electrical properties; detectors;
机译:金刚石薄膜的红外光学性能和CVD金刚石探测器的电性能
机译:高度取向的B掺杂金刚石薄膜的电学性质的微观测量:晶界的影响
机译:高度取向的B掺杂金刚石薄膜的电学性质的微观测量:晶界的影响
机译:HFCVD法沉积的纳米结晶金刚石膜的结构,电气和光学表征
机译:平均晶粒尺寸对多晶金刚石膜功函的影响。
机译:通过粒度工程定制石墨烯薄膜的热和电传输性质
机译:SiC晶粒增强塑料切割的多晶金刚石工具的磨损。 SiC和钻石粒度的影响。