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Structural, electrical, and optical properties of as-grown and heat treated ultra-thin SnS films

机译:生长和热处理的超薄SnS薄膜的结构,电学和光学性质

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摘要

The composition, structural, electrical, and optical properties of as-grown and heat treated tin-mono-sulfide (SnS) ultra-thin films have been studied. The ultra-thin SnS films were prepared on glass substrates by thermal resistive evaporation technique. A11 the SnS films contained nanocrystallites and exhibited p-type conductivity with a low Hall-mobility, <50 cm~2/Vs. All these films are highly tin rich in nature and exhibited orthorhombic crystal structure. As compared to other films, the SnS films annealed at 300 ℃ showed a low electrical resistivity of -36 ficm with an optical band gap of -1.98 eV. The observed electrical and optical properties of a1l the films are discussed based on their composition and structural parameters. These nanocrystalline ultra-thin SnS films could be expected as a buffer layer for the development of tandem solar cell devices due to their low-resistivity and high absorbability with an optimum band gap.
机译:研究了成膜和热处理过的单硫化锡(SnS)超薄薄膜的组成,结构,电学和光学性质。通过热阻蒸发技术在玻璃基板上制备了超薄SnS薄膜。 A11的SnS薄膜含有纳米晶体,并表现出p型导电性,且霍尔迁移率<50 cm〜2 / Vs。所有这些膜都具有很高的自然锡含量,并表现出正交晶体结构。与其他薄膜相比,在300℃退火的SnS薄膜显示出-36 ficm的低电阻率和-1.98 eV的光学带隙。根据膜的组成和结构参数,讨论了膜的电学和光学特性。这些纳米晶超薄SnS膜由于其低电阻率和高吸收性以及最佳的带隙,有望作为串联太阳能电池器件开发的缓冲层。

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