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首页> 外文期刊>Thin Solid Films >Comparison of charge distributions in CIGS thin-film solar cells with ZnS/(Zn,Mg)O and CdS/i-ZnO buffers
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Comparison of charge distributions in CIGS thin-film solar cells with ZnS/(Zn,Mg)O and CdS/i-ZnO buffers

机译:具有ZnS /(Zn,Mg)O和CdS / i-ZnO缓冲液的CIGS薄膜太阳能电池中电荷分布的比较

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摘要

The commonly used CdS/i-ZnO buffer system in Cu(In,Ga)Se_2 (CIGS) thin-film solar cells was substituted by ZnS/(Zn,Mg)O. ZnS has a higher transmission in the short wavelength range due to the higher bandgap energy E_g =3.7 eV compared to CdS with E_g =2.4 eV. Unfortunately, in our experiments the resulting gain in short-circuit current density j_sc as the result of reduced absorption losses in the blue wavelength region is mostly accompanied by a decrease in open-circuit voltage V_OC of the devices with ZnS buffer. This contribution discusses possible explanations for the systematically lower open-circuit voltages of the devices with a ZnS buffer layer. The carrier collection properties of the devices with a ZnS buffer were investigated by electron beam induced current measurements in the junction configuration. The maximum of the collection probability for ZnS cells is located in the CIGS bulk and not near the buffer/CIGS interface like for solar cells with CdS buffer. Additionally, we observed a larger space charge width compared to devices with a CdS buffer. This finding concurs with the considerably lower capacitance values and also lower charge densities in ZnS-buffered devices, as determined by capacitance voltage measurements.Based on these findings, the main reason for the lower open-circuit voltages of our ZnS devices is that the charge densities are lower than for the CdS/i-ZnO cells.
机译:Cu(In,Ga)Se_2(CIGS)薄膜太阳能电池中常用的CdS / i-ZnO缓冲系统被ZnS /(Zn,Mg)O取代。与具有E_g = 2.4 eV的CdS相比,由于具有更高的带隙能量E_g = 3.7 eV,ZnS在短波长范围内具有更高的透射率。不幸的是,在我们的实验中,由于减少了蓝色波长区域中的吸收损耗而导致的短路电流密度j_sc的增加主要伴随着带有ZnS缓冲器的器件的开路电压V_OC的降低。该贡献讨论了对于具有ZnS缓冲层的设备的系统性较低开路电压的可能解释。通过电子束感应电流测量结结构,研究了具有ZnS缓冲液的器件的载流子收集特性。 ZnS电池的最大收集概率位于CIGS主体中,而不是像具有CdS缓冲区的太阳能电池一样,不靠近缓冲区/ CIGS界面。此外,与带有CdS缓冲区的设备相比,我们观察到更大的空间电荷宽度。这一发现与通过电容电压测量确定的ZnS缓冲器件中的电容值明显较低以及电荷密度较低有关。基于这些发现,我们ZnS器件开路电压较低的主要原因是电荷密度低于CdS / i-ZnO电池。

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  • 来源
    《Thin Solid Films》 |2011年第21期|p.7549-7552|共4页
  • 作者单位

    Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg (ZSW), Industriestrasse 6, D-70565 Stuttgart, Germany;

    Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg (ZSW), Industriestrasse 6, D-70565 Stuttgart, Germany;

    Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg (ZSW), Industriestrasse 6, D-70565 Stuttgart, Germany;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    CIGS; Thin films; Buffer; CdS; ZnS; (Zn,Mg)O; EBIC; Capacitance; Charge distribution;

    机译:CIGS;薄膜;缓冲液;CdS;ZnS;(Zn;Mg)O;EBIC;电容;电荷分布;

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