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A time-dependent direct current potential drop method to evaluate thickness of an oxide layer formed naturally and thermally on a large surface of carbon steel

机译:基于时间的直流电势下降方法,用于评估在碳钢大表面上自然而热地形成的氧化层的厚度

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摘要

This study describes the use of a time-dependent spring-loaded four-point-probe technique to measure the direct current potential drop (DCPD) on oxidized test surfaces for different spring force values, with the purpose of evaluating the thickness of the oxide layer. The force of the spring attached to the current probe was reduced by inserting spacers with different thicknesses under the supporting legs of the sensor block. The PD measurement was first performed on machined sample exposed to the atmosphere for approximately 6 months. The sample was made of carbon steel (SS400). Then, the thickness of the oxide layer formed on the surface of the sample was increased by heat treatment The PD was also measured on the samples subjected to heat treatment The measurements were performed at different locations on the test surface under the same experimental conditions. The experimental results establish a relationship between the spring force and the time required for the current probe to penetrate the oxide layer. This article also proposes a procedure for evaluating the thickness of the oxide layer. Finally, the proposed method was used to evaluate the thickness of the oxide layer formed on a large surface. The method was performed to evaluate thickness of single phase monolayer oxide in the range of 3.5-8.7μm. To demonstrate the validity and accuracy of the proposed method, the obtained thickness was compared to the thickness measured directly using a field emission scanning electron microscopy.
机译:这项研究描述了使用随时间变化的弹簧四点探针技术,针对不同的弹簧力值来测量氧化测试表面上的直流电势降(DCPD),目的是评估氧化物层的厚度。通过将不同厚度的垫片插入传感器块的支撑脚下,可以减小弹簧在电流探头上的作用力。 PD测量首先在暴露于大气中约6个月的机加工样品上进行。样品由碳钢(SS400)制成。然后,通过热处理增加形成在样品表面上的氧化物层的厚度。还对经受热处理的样品进行PD测量。在相同的实验条件下,在测试表面的不同位置进行测量。实验结果在弹力和电流探针穿透氧化层所需的时间之间建立了关系。本文还提出了一种评估氧化物层厚度的方法。最后,所提出的方法用于评估在大表面上形成的氧化物层的厚度。进行该方法以评价单相单层氧化物的厚度在3.5-8.7μm的范围内。为了证明所提出方法的有效性和准确性,将获得的厚度与使用场发射扫描电子显微镜直接测量的厚度进行了比较。

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