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Effects of oxygen stoichiometry on resistive switching properties in amorphous tungsten oxide films

机译:氧化学计量对非晶氧化钨薄膜电阻转换特性的影响

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摘要

The bipolar resistance switching in WO_(3+δ) films sandwiched by Al and Pt electrodes was investigated by changing additional oxygen content (δ). Reliable switching voltages and retention were observed for all samples. As δ increases the bi-stable current-voltage characteristics fluctuate leading to unstable switching power consumption. An analysis of the temperature dependence of the bi-stable resistance states revealed additional features that thermionic emission and metallic conduction co-contribute to the electrical transport of the resistance states. The authors propose that the observed resistance switching is due to the combined effects of potential modification near the interface and the formation of a metallic channel.
机译:通过改变额外的氧含量(δ),研究了夹在Al和Pt电极之间的WO_(3 +δ)薄膜中的双极电阻转换。所有样品均观察到可靠的开关电压和保持力。随着δ的增加,双稳态电流-电压特性会波动,从而导致不稳定的开关功耗。对双稳态电阻状态的温度依赖性的分析揭示了附加特征,即热电子发射和金属传导共同贡献于电阻状态的电传输。作者提出,观察到的电阻切换是由于界面附近的电位修改和金属通道形成的综合作用所致。

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  • 来源
    《Thin Solid Films》 |2012年第16期|p.5451-5454|共4页
  • 作者单位

    Department of Semiconductor Science, Dongguk University, Seoul 100-715, Republic of Korea;

    Department of Semiconductor Science, Dongguk University, Seoul 100-715, Republic of Korea;

    Department of Semiconductor Science, Dongguk University, Seoul 100-715, Republic of Korea;

    Department of Semiconductor Science, Dongguk University, Seoul 100-715, Republic of Korea;

    Department of Semiconductor Science, Dongguk University, Seoul 100-715, Republic of Korea;

    Department of Physics, Dongguk University, Seoul 100-715, Republic of Korea;

    Department of Physics, Hanyang University, Seoul 133-791, Republic of Korea;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    tungsten oxide; sputtering; resistive switching;

    机译:氧化钨溅射电阻切换;

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