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机译:氧化学计量对非晶氧化钨薄膜电阻转换特性的影响
Department of Semiconductor Science, Dongguk University, Seoul 100-715, Republic of Korea;
Department of Semiconductor Science, Dongguk University, Seoul 100-715, Republic of Korea;
Department of Semiconductor Science, Dongguk University, Seoul 100-715, Republic of Korea;
Department of Semiconductor Science, Dongguk University, Seoul 100-715, Republic of Korea;
Department of Semiconductor Science, Dongguk University, Seoul 100-715, Republic of Korea;
Department of Physics, Dongguk University, Seoul 100-715, Republic of Korea;
Department of Physics, Hanyang University, Seoul 133-791, Republic of Korea;
tungsten oxide; sputtering; resistive switching;
机译:氧化学计量对非晶氧化钨薄膜电致变色性能的影响
机译:通过氮掺杂在氧化钨薄膜中改善的电阻开关性能
机译:氧化钨/氧化铟锡/金记忆装置中的氧离子迁移调制的双极电阻和互补电阻切换
机译:电致变色溶胶-凝胶沉积氧化钨薄膜的微观结构和化学计量效应
机译:反应性蒸发的二氧化钒薄膜的光学性质和化学计量比(相变,缺陷,转换)。
机译:完全透明和灵敏度可编程的无定形铟 - 氧化锌基氧化物薄膜晶体管的生物传感器平台具有电阻开关存储器
机译:中孔非晶氧化钨电致变色膜:其良好开关行为的拉曼分析