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On the vSiO infrared absorption of polysiloxane films

机译:对聚硅氧烷薄膜的vSiO红外吸收

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The infrared absorption of polysiloxanes involves a strong band at around 1050 cm~(-1) , attributed to the antisymmetric vibration of siloxane bridges. The splitting of this band into two components is generally attributed to coupling between next-neighbor siloxane groups along the polysiloxane chain. From a quantitative analysis of the spectra of these materials, we find that this splitting is larger when the material is in thin-film form, and that the relative intensity of the two components is polarization dependent. We show that these effects are fully understandable in the theoretical framework of infrared absorption by thin films, and are related to long-range dipolar interactions responsible for the longitudinal-transverse splitting effect in crystalline materials. As a consequence, the polarization dependence of the infrared absorption observed for thin films does not appear to be associated with an orientational ordering in the film.
机译:聚硅氧烷的红外吸收在1050 cm〜(-1)附近有一个很强的谱带,这归因于硅氧烷桥的不对称振动。该带分成两个成分通常归因于沿着聚硅氧烷链的相邻硅氧烷基团之间的偶联。通过对这些材料的光谱进行定量分析,我们发现,当材料为薄膜形式时,这种分裂较大,并且这两个分量的相对强度与偏振有关。我们表明,这些效应在薄膜吸收红外的理论框架中是完全可以理解的,并且与负责结晶材料中纵向横向分裂效应的长距离偶极相互作用有关。结果,对于薄膜观察到的红外吸收的偏振依赖性似乎与薄膜中的取向次序无关。

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