Structural and microstructural characterization of Bi2_Te_3 films deposited by the close space vapor transport method using scanning electron microscopy and X-ray diffraction techniques

摘要

We report the structural and microstructural features of Bi2_Te_3 films deposited by close space vapor transport (CSVT) technique on soda-lime glass substrates. Different phases are obtained depending on the substrate temperature, as well as changes in the thermoelectric properties of the CSVT-Bi2_Te_3 films. The relationship between the structural and electrical properties of the films is present.