机译:使用聚焦离子束铣削和成像技术在亚微米尺度上测量薄膜中的残余应力
Department of Engineering Science, University of Oxford, Parks Road, Oxford 0X1 3PJ, UK;
Department of Mechanical Engineering, National University of Singapore, 9 Engineering Drive 1,117576, Singapore;
Department of Mechanical Engineering, National University of Singapore, 9 Engineering Drive 1,117576, Singapore;
Department of Engineering Science, University of Oxford, Parks Road, Oxford 0X1 3PJ, UK;
University of Rome "ROMA TRE", Mechanical and Industrial Engineering Department, Via Vasca Navale 79, 00146 Rome, Italy;
University of Rome "ROMA TRE", Mechanical and Industrial Engineering Department, Via Vasca Navale 79, 00146 Rome, Italy;
Department of Mechanical Engineering, National University of Singapore, 9 Engineering Drive 1,117576, Singapore;
Department of Engineering Science, University of Oxford, Parks Road, Oxford 0X1 3PJ, UK;
residual stress; focused ion beam; digital image correlation; strain relief function;
机译:通过聚焦离子束铣削和数字图像相关性测量薄膜中残余应力的简单方法
机译:微米级残余应力测量:聚焦离子束(FIB)研磨和纳米压痕测试
机译:微米级残余应力测量:聚焦离子束(FIB)铣削和纳米压痕测试
机译:使用聚焦离子束的半破坏性环芯钻探方法在薄膜中的残余应力测量
机译:压电瘤应用Pb(Zr0.3Ti0.7)O3薄膜对缩放效应对缩放效应的影响
机译:利用离子束铣削后的应变场SEM图像上的数字图像相关性测量薄膜的残余应力
机译:聚焦离子束半破坏环核钻孔法测量薄膜中的残余应力