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Epitaxial growth of CdTe thin film on cube-textured Ni by metal-organic chemical vapor deposition

机译:金属有机化学气相沉积法在立方织构镍上外延生长CdTe薄膜

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摘要

Single crystal-like CdTe thin film has been grown by metalorganic chemical vapor deposition on cube-textured Ni(100) substrate. Using X-ray pole figurejneasurements we observed the epitaxial relationship of {111}_(CdTe)//{001}_(Ni) with [110]_(CdTe)//[010]_(Ni) and [112]_(CdTe)//[100]_(Ni).The 12 diffraction peaks in the (111) pole figure of CdTe film and their relative positions with respect to the four peak positions in the (111) pole figure of Ni substrate are consistent withfour equivalent orientational domains of CdTe with three to four superlat-tice match of about 1.6% in the [110] direction of CdTe and the [010] direction of Ni. The electron backscat-tered diffraction images show that the CdTe domains are 30° oriented from each other. These high structural quality films may find applications in low cost optoelectronic devices.
机译:单晶状CdTe薄膜已通过金属有机化学气相沉积法在立方织构的Ni(100)衬底上生长。使用X射线极图法,我们观察到{111} _(CdTe)// {001} _(Ni)与[110] _(CdTe)// [010] _(Ni)和[112] _的外延关系(CdTe)// [100] _(Ni).CdTe膜的(111)极图中的12个衍射峰及其相对于Ni衬底(111)极图中的四个峰位置的相对位置是一致的CdTe的四个等效取向域在CdTe的[110]方向和Ni的[010]方向上具有三到四个超晶格匹配,约为1.6%。电子背散射的衍射图像显示CdTe域彼此呈30°取向。这些高结构质量的薄膜可能会在低成本光电设备中找到应用。

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  • 来源
    《Thin Solid Films》 |2012年第6期|p.1862-1865|共4页
  • 作者单位

    Department of Physics, Applied Physics and Astronomy, Rensselaer Polytechnic Institute, Troy, NY, 12180-3590, USA;

    Department of Electrical, Computer, and Systems Engineering, Rensselaer Polytechnic Institute, Troy, NY, 12180-3590, USA;

    Department of Chemical and Biological Engineering, Rensselaer Polytechnic Institute, Troy, NY, 12180-3590, USA;

    Department of Physics, Applied Physics and Astronomy, Rensselaer Polytechnic Institute, Troy, NY, 12180-3590, USA;

    Oak Ridge National Lab, Oak ridge, TN, 37831-6116, USA;

    US Army ARDEC Benet Labs, Watervliet, NY, 12189-4050, USA;

    Department of Electrical, Computer, and Systems Engineering, Rensselaer Polytechnic Institute, Troy, NY, 12180-3590, USA;

    Department of Physics, Applied Physics and Astronomy, Rensselaer Polytechnic Institute, Troy, NY, 12180-3590, USA;

    Department of Physics, Applied Physics and Astronomy, Rensselaer Polytechnic Institute, Troy, NY, 12180-3590, USA;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    epitaxy; cadmium telluride; cube-textured nickel; metal organic chemical vapor deposition; X-ray pole figures; electron backscattered diffraction; oriented domains;

    机译:外延碲化镉立方晶镍;金属有机化学气相沉积;X射线极图;电子背散射衍射;定向领域;
  • 入库时间 2022-08-17 13:40:38

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