机译:X射线法测定薄膜的杨氏模量和泊松比
Centers for Measurement Standards, Industrial Technology Research Institute, No.321, Sec.2, Kuangfu Rd., Hsinchu 30011, Taiwan;
Centers for Measurement Standards, Industrial Technology Research Institute, No.321, Sec.2, Kuangfu Rd., Hsinchu 30011, Taiwan;
Centers for Measurement Standards, Industrial Technology Research Institute, No.321, Sec.2, Kuangfu Rd., Hsinchu 30011, Taiwan;
Centers for Measurement Standards, Industrial Technology Research Institute, No.321, Sec.2, Kuangfu Rd., Hsinchu 30011, Taiwan;
Thin film; X-ray diffraction; Young's modulus; Poisson's ratio; Copper; Residual stress;
机译:用X射线法测定薄膜的杨氏模量和泊松比(544C卷,第201页,2015年)
机译:结合sin〜2ψX射线衍射和激光曲率法测定薄膜的杨氏模量和泊松比
机译:同时测定薄膜的泊松比和杨氏弹性模量的实用方法
机译:同时确定杨氏模量,热膨胀系数,泊松比和硅晶片上的薄膜厚度
机译:泊松比对超声技术建模杨氏模量的影响
机译:杨氏模量和泊松比与地球物理应用的关系
机译:硅上(111)取向氮化scan薄膜的杨氏模量,泊松比以及残余应力和应变