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In-situ phase formation study of copper indium diselenide absorber layers from CuIn nanoparticles and evaporated selenium

机译:CuIn纳米粒子和蒸发硒在原位形成相的研究

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摘要

In this work CuInSe_2 (CISe) thin films were fabricated by rapid thermal processing of printed CuIn nanoparticles and thermally evaporated selenium as precursor layer. Research is focused on real-time investigations such as in-situ X-ray diffraction and dynamic scanning calorimetry. These measurements show CISe formation starting at 300 ℃ Significant amount of intermediate phases as reported for state-of-the-art rapid thermal processing of stacked elemental layer was not observed. The morphology of the nanoparticulate layers was examined by field emission scanning electron microscopy. Grain size developed from nanosized binary CuIn nanoparticles to microsized CISe grains. Porosity decreases in the temperature range from 340 ℃ to 540 ℃.
机译:在这项工作中,CuInSe_2(CISe)薄膜是通过对印刷的CuIn纳米粒子和热蒸发的硒作为前驱体层进行快速热处理而制成的。研究集中于实时研究,例如原位X射线衍射和动态扫描量热法。这些测量结果表明,CISe的形成始于300℃,没有观察到大量的中间相,这是对层叠式元素层的最新快速热处理的报道。通过场发射扫描电子显微镜检查纳米颗粒层的形态。晶粒尺寸从纳米二元CuIn纳米颗粒发展为微米级CISe晶粒。孔隙率在340℃至540℃的温度范围内降低。

著录项

  • 来源
    《Thin Solid Films》 |2013年第15期|133-137|共5页
  • 作者单位

    Department of Materials Science, Chair of Materials for Electronics and Energy Technology, Friedrich-AIexander-University Erlangen-Nuernberg, Martensstr. 7, 91058 Erlangen, Germany;

    Chair for Crystallography and Structural Physics, Friedrich-Alexander-University Erlangen-Nuemberg, Staudtstr. 3, 91058 Erlangen, Germany;

    Chair for Crystallography and Structural Physics, Friedrich-Alexander-University Erlangen-Nuemberg, Staudtstr. 3, 91058 Erlangen, Germany;

    Department of Materials Science, Chair of Materials for Electronics and Energy Technology, Friedrich-AIexander-University Erlangen-Nuernberg, Martensstr. 7, 91058 Erlangen, Germany;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    CuInSe_2; Chalcopyrite; Intermetallic nanoparticles; Real-time investigation; XRD; Dynamic scanning calorimetry;

    机译:CuInSe_2;黄铜矿;金属间纳米粒子;实时调查;XRD;动态扫描量热法;

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