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Effect of high temperature thermal treatment of (100) γ-LiAlO_2 substrate on epitaxial growth of ZnO films by plasma-assisted molecular beam epitaxy

机译:等离子体辅助分子束外延对(100)γ-LiAlO_2衬底进行高温热处理对ZnO薄膜外延生长的影响

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摘要

Non-polar ZnO thin films were fabricated on (100)γ-LiAlO_2 substrates by plasma-assisted molecular beam epitaxy. The effect of high temperature thermal treatment of substrate on the crystalline orientation and quality of ZnO thin film was investigated. The film grown on (100) γ-LiAlO_2 substrate without high temperature thermal treatment consists of domains of both polar and non-polar orientations as identified by the X-ray diffraction pattern. Using high temperature thermal treatment of substrate, the growth of polar ZnO has been suppressed effectively. Besides, high temperature thermal treatment of substrate improves the crystalline quality of epitaxial ZnO thin film, which exhibits a smaller full width at half maximum value of ZnO (101~- 0) diffraction peak and a weaker deep level emission of photoluminescence. The suppression of polar ZnO growth and the quality improvement of the epitaxial ZnO films are due to the improvement of surface morphology and roughness of the substrate upon high temperature treatment.
机译:通过等离子辅助分子束外延在(100)γ-LiAlO_2衬底上制备了非极性ZnO薄膜。研究了衬底的高温热处理对ZnO薄膜的晶体取向和质量的影响。在未经高温热处理的情况下,在(100)γ-LiAlO_2衬底上生长的薄膜由X射线衍射图确定的极性和非极性方向的畴组成。使用衬底的高温热处理,可以有效地抑制极性ZnO的生长。此外,衬底的高温热处理提高了外延ZnO薄膜的晶体质量,在ZnO(101-0)衍射峰的最大值的一半处表现出较小的全宽,并且较弱的光致发光深层发射。抑制极性ZnO的生长和提高外延ZnO膜的质量是由于高温处理后衬底的表面形态和粗糙度得到了改善。

著录项

  • 来源
    《Thin Solid Films》 |2014年第1期|156-159|共4页
  • 作者单位

    State Key Laboratory of Silicon Materials, Cyrus Tang Center for Sensor Materials and Applications, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

    State Key Laboratory of Silicon Materials, Cyrus Tang Center for Sensor Materials and Applications, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

    State Key Laboratory of Silicon Materials, Cyrus Tang Center for Sensor Materials and Applications, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

    State Key Laboratory of Silicon Materials, Cyrus Tang Center for Sensor Materials and Applications, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

    State Key Laboratory of Silicon Materials, Cyrus Tang Center for Sensor Materials and Applications, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

    State Key Laboratory of Silicon Materials, Cyrus Tang Center for Sensor Materials and Applications, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

    State Key Laboratory of Silicon Materials, Cyrus Tang Center for Sensor Materials and Applications, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

    State Key Laboratory of Silicon Materials, Cyrus Tang Center for Sensor Materials and Applications, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

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  • 正文语种 eng
  • 中图分类
  • 关键词

    Epitaxial growth; Non-polar; ZInc oxide; Thin films; lithium aluminate; Plasma-assisted molecular beam epitaxy;

    机译:外延生长;非极性氧化锌薄膜;铝酸锂;等离子体辅助分子束外延;

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