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首页> 外文期刊>Thin Solid Films >High-mobility metal-oxide thin-film transistors by spray deposition of environmentally friendly precursors
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High-mobility metal-oxide thin-film transistors by spray deposition of environmentally friendly precursors

机译:通过喷涂环保前体的高迁移率金属氧化物薄膜晶体管

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摘要

The synthesis of versatile, and non-toxic precursors for ambient-air deposition of semiconducting metal-oxide thin films by spray pyrolysis is reported. The resulting thin films yield stable and reproducible performance in thin-film transistors. The precursors are based on reactions of metal salts and an organic ammonium source in water. The precursor preparation is highly versatile with respect to low-level handling requirements (i.e. in air) and miscibility for the synthesis of customized mixed metal oxides. The precursor solutions are deposited by spray pyrolysis and integrated into bottom-gate test structures with staggered source and drain contacts. Indium zinc oxide thin films deposited from a precursor with an [In]/[Zn] ratio of 3:1 exhibit an on-off current ratio of 10~6 with a calculated saturation mobility of 14.1 cm~2 V~(-1) s~(-1) ± 1.1 cm~2 V~(-1) s~(-1) at a drain voltage of 40 V. The demonstrated route to non-toxic molecular precursors for low-temperature thin-film processing in ambient atmosphere benefits from low cost of educts, environmentally friendly solvents, minimized health risk when compared to nanoparticle processing, and an excellent performance for electronic applications.
机译:报道了通过喷雾热解合成用于环境空气沉积半导体金属氧化物薄膜的通用且无毒的前体。所得的薄膜在薄膜晶体管中产生稳定且可再现的性能。前体基于金属盐与有机铵源在水中的反应。就低水平处理要求(即在空气中)和用于合成定制混合金属氧化物的可混溶性而言,前体制备具有高度的通用性。前驱体溶液通过喷雾热解沉积,并集成到具有交错的源极和漏极触点的底栅测试结构中。由[In] / [Zn]比为3:1的前驱体沉积的铟锌氧化物薄膜的开-关电流比为10〜6,计算出的饱和迁移率为14.1 cm〜2 V〜(-1)漏极电压为40 V时s〜(-1)±1.1 cm〜2 V〜(-1)s〜(-1)。已证明了在室温下用于低温薄膜处理的无毒分子前体的途径与纳米颗粒工艺相比,大气中的离析物成本低廉,环境友好的溶剂,对健康的危害最小,并且在电子应用中具有出色的性能。

著录项

  • 来源
    《Thin Solid Films》 |2014年第28期|114-117|共4页
  • 作者单位

    Fraunhofer Institute for Integrated Systems and Device Technology IISB, Schottkystr. 10, 91058 Erlangen, Germany;

    Fraunhofer Institute for Integrated Systems and Device Technology IISB, Schottkystr. 10, 91058 Erlangen, Germany,Cluster of Excellence 'Engineering of Advanced Materials' at Friedrich-Alexander Universitaet Erlangen-Nuernberg, Naegelsbachstrasse 49b, 91052 Erlangen, Germany;

    Fraunhofer Institute for Integrated Systems and Device Technology IISB, Schottkystr. 10, 91058 Erlangen, Germany;

    Fraunhofer Institute for Integrated Systems and Device Technology IISB, Schottkystr. 10, 91058 Erlangen, Germany;

    Fraunhofer Institute for Integrated Systems and Device Technology IISB, Schottkystr. 10, 91058 Erlangen, Germany,Cluster of Excellence 'Engineering of Advanced Materials' at Friedrich-Alexander Universitaet Erlangen-Nuernberg, Naegelsbachstrasse 49b, 91052 Erlangen, Germany,Friedrich-Alexander-Universitat Erlangen-Nuemberg, Lehrstuhl fuer Elektronische Bauelemente, Cauerstr. 6, 91058 Erlangen, Germany;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Solution processing; Spray pyrolysis; Precursor; Metal oxide semiconductors; Indium zinc oxide;

    机译:溶液处理;喷雾热解;前体;金属氧化物半导体;铟锌氧化物;

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