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首页> 外文期刊>Thin Solid Films >Influence of hydrogen sulfide annealing on copper-zinc-tin-sulfide solar cells sputtered from a quaternary compound target
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Influence of hydrogen sulfide annealing on copper-zinc-tin-sulfide solar cells sputtered from a quaternary compound target

机译:硫化氢退火对四元复合靶溅射铜锌锡硫化物太阳能电池的影响

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摘要

With a theoretical efficiency around 30% and an optimized band gap for sunlight absorption, Cu2ZnSnS4 (CZTS) is a promising, earth-abundant, material for thin film solar cells. Sputtering CZTS from a quaternary compound target is a quick and potentially industrial-scaled process that has not been investigated deeply yet. Our approach is based on an in-line vacuum system for the complete device. CZTS is sputtered from a compound target on a sodium molybdate (MoNa) pre-sputtered stainless steel substrate, and then annealed in high-pressure H2S atmosphere. A 1 mu m thick absorber is obtained within 7 minute sputtering. Top layers are then deposited, without vacuum breaking. The effects of different annealing temperatures on the absorber morphology and composition are investigated. It is observed that recrystallization already occurs at 420 degrees C and that crystallinity improves with increasing temperature up to 550 degrees C. However, micro-sphere formation underneath the film degrades the corresponding solar cell performance dramatically above 510 degrees C. It is shown that sodium is needed in order to enhance recrystallization of CZTS but the MoNa layer thickness seems not to be a critical parameter. Scanning electron microscopy, X-ray diffraction, X-ray fluorescence and current-voltage measurement were used to characterize the samples. (C) 2014 Elsevier B.V. All rights reserved.
机译:Cu2ZnSnS4(CZTS)具有约30%的理论效率和最佳的能吸收阳光的带隙,是一种有前途的,富含地球的薄膜太阳能电池材料。从四元复合靶溅射CZTS是一种快速且可能具有工业规模的过程,尚未进行深入研究。我们的方法基于用于整个设备的在线真空系统。将CZTS从复合靶材溅射到钼酸钠(MoNa)预溅射的不锈钢基板上,然后在高压H2S气氛中进行退火。在7分钟的溅射时间内获得1微米厚的吸收剂。然后沉积顶层,而不会破坏真空。研究了不同退火温度对吸收体形貌和组成的影响。可以观察到,在420摄氏度时已经发生了重结晶,并且随着温度升高至550摄氏度,结晶度得到了改善。但是,在薄膜下方形成微球会使510摄氏度以上的太阳能电池性能显着降低。为了增强CZTS的再结晶需要添加MoNa层,但MoNa层的厚度似乎不是关键参数。使用扫描电子显微镜,X射线衍射,X射线荧光和电流-电压测量来表征样品。 (C)2014 Elsevier B.V.保留所有权利。

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