首页> 外文期刊>Thin Solid Films >Effects of the deposition condition on the microstructure and properties of ZnO thin films deposited by metal organic chemical vapor deposition with ultrasonic nebulization
【24h】

Effects of the deposition condition on the microstructure and properties of ZnO thin films deposited by metal organic chemical vapor deposition with ultrasonic nebulization

机译:沉积条件对超声雾化金属有机化学气相沉积ZnO薄膜微结构和性能的影响

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

ZnO thin films were deposited on glass substrates by metal-organic chemical vapor deposition with ultrasonic nebulization at different substrate temperatures and source solution concentrations, and the effects of the deposition conditions on the microstructure and properties of the ZnO films were investigated. The deposition rate was controlled by the rate of the surface reaction at low substrate temperatures and by the rate of mass transfer of the reactants at high substrate temperatures. The transition temperature between the surface-reaction-controlled condition and the mass-transfer-controlled condition increased with increasing concentration of the source solution. The microstructure and crystallographic properties of the films were largely affected by the deposition conditions. The ZnO thin films grown under the surface-reaction-controlled conditions were composed of columnar grains with a plate-pillar structure and some open spaces between the columnar grains. The crystal direction of the grains was oriented randomly. On the other hand, under themass-transfer-controlled condition, the ZnO films adopted a dense rock-like structure composed of very large grains, whose crystal directions were highly [001] oriented perpendicular to the substrate surface. The resistivity of the films depended mainly on the mobility of the charge carriers, which varied significantly with the microstructure. The resistivity of the films with the columnar structure was much higher than that of the films with the rock-like structure because of the open space between the columnar grains. The mean transmittance of the films in the visible range was more than 80%. The optical band gap of the films was approximately 3.3 eV. (C) 2015 Elsevier B.V. All rights reserved.
机译:通过金属有机化学气相沉积,超声雾化在不同的衬底温度和源溶液浓度下,在玻璃衬底上沉积ZnO薄膜,并研究了沉积条件对ZnO薄膜的微观结构和性能的影响。沉积速率由低基材温度下的表面反应速率和高基材温度下反应物的传质速率控制。随着原料溶液浓度的增加,在表面反应控制条件和传质控制条件之间的转变温度升高。薄膜的微观结构和晶体学性质在很大程度上受沉积条件的影响。在表面反应控制的条件下生长的ZnO薄膜由具有板柱状结构的柱状晶粒和柱状晶粒之间的一些开放空间组成。晶粒的晶体方向随机取向。另一方面,在质量转移控制的条件下,ZnO膜采用由非常大的晶粒组成的致密的岩石状结构,其晶体方向垂直于衬底表面高度为[001]。薄膜的电阻率主要取决于电荷载流子的迁移率,该迁移率随微观结构而显着变化。由于柱状晶粒之间的空隙,具有柱状结构的膜的电阻率比具有岩石状结构的膜的电阻率高得多。薄膜在可见光范围内的平均透射率大于80%。薄膜的光学带隙约为3.3 eV。 (C)2015 Elsevier B.V.保留所有权利。

著录项

  • 来源
    《Thin Solid Films》 |2016年第30期|157-162|共6页
  • 作者

    Lee Choon-Ho; Choi Min-Seok;

  • 作者单位

    Keimyung Univ, Dept Mat Engn, 1095 Dalgubeol Daero, Daegu 704701, South Korea;

    Keimyung Univ, Dept Mat Engn, 1095 Dalgubeol Daero, Daegu 704701, South Korea;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    ZnO; Thin films; MOCVD;

    机译:ZnO;薄膜;MOCVD;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号