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首页> 外文期刊>Thin Solid Films >Heteroepitaxy of large grain Ge film on cube-textured Ni(001) foils through CaF2 buffer layer
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Heteroepitaxy of large grain Ge film on cube-textured Ni(001) foils through CaF2 buffer layer

机译:通过CaF2缓冲层在立方织构Ni(001)箔上的大晶粒Ge膜的异质外延

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摘要

Cube-textured Ni(001) foils have been considered as a viable alternative substrate to grow high quality functional films for large area optoelectronic devices. In this work, we report the heteroepitaxial growth of CaF2(001) films on cube-textured Ni(001) foils at 350-600 degrees C with in-plane orientation of CaF2[110]//Ni[100] and CaF2[(1) over bar 10]//Ni[010] with 45 degrees rotation respect to the Ni(001) substrate. Unlike CaF2(111)/Ni(001) films where there exist four independent rotational domains with rotational domain boundaries, CaF2(001)/Ni(001) contains no rotational domains or rotational domain boundaries. This makes CaF2(001)/Ni(001) films better candidates as templates for the growth of high quality functional semiconductors. We also demonstrate that Ge(001) film with no rotational domains and with a grain size of similar to 50 mu m similar to that of the Ni substrate can be grown on the CaF2(001) buffered Ni substrate. (C) 2016 Elsevier B.V. All rights reserved.
机译:立方纹理化的Ni(001)箔已被认为是可行的替代基材,可用于生产大面积光电器件的高质量功能膜。在这项工作中,我们报告了CaF2(001)膜在立方结构的Ni(001)箔上在350-600摄氏度下以CaF2 [110] // Ni [100]和CaF2 [[ 1)相对于Ni(001)衬底旋转45度的钢筋10] // Ni [010]上方。与CaF2(111)/ Ni(001)薄膜存在四个具有旋转域边界的独立旋转域不同,CaF2(001)/ Ni(001)不包含旋转域或旋转域边界。这使得CaF2(001)/ Ni(001)薄膜成为高质量功能半导体生长的模板的更好候选者。我们还证明,可以在CaF2(001)缓冲的Ni衬底上生长没有旋转域且晶粒大小类似于Ni衬底的50μm的Ge(001)膜。 (C)2016 Elsevier B.V.保留所有权利。

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