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Fabrication of high band gap kesterite solar cell absorber materials for tandem applications

机译:串联应用的高禁带型硅藻土太阳能电池吸收体材料的制造

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摘要

Using the thermal annealing of evaporated metallic precursors in successive H2Se and H2S atmospheres, it was possible to reproducibly manufacture kesterite absorber material for solar cell applications with a sulfur content varying from 30% to 100%. Respective band gaps for these sulfur inclusions were measured at approximately 1.45 eV and 2.0 eV. A recipe was devised for which results could be reproduced within an error margin of ±5% and the influence of the H2S pressure during the post sulfurization was negligible on all measurable and observable parameters. The evolution of the S/Se ratio in the sample was observed to be linearly dependent on the annealing time. It was also observed that at very early stages of the post-sulfurization, both the original Cu2(Zn,Ge)Se4(CZGSe) and a primary Cu2(Zn,Ge)(S,Se)4(CZGSSe) phase with a sulfur inclusion of ~30% coexist in the sample. The (112) x-ray diffraction (XRD) reflection of the CZGSe phase progressively disappears in favor for the first mixed CZGSSe phase. Using grazing incidence-XRD, the S/Se ratio was shown to be inhomogeneous. Indeed, the XRD measurement of the top layers led to the calculation of higher sulfur inclusions than was the case when measuring the bulk material. Top-scanning electron microscopy (SEM) as well as cross-SEM measurements were taken in order to determine the impact of the sulfur inclusion on the crystal growth and the overall quality of the produced absorber layers. The obtained images revealed a reduction in crystal size and the appearance of numerous holes in the layer as the S/Se ratio is increased.
机译:通过在连续的H2Se和H2S气氛中对蒸发的金属前驱体进行热退火,可以可重现地生产硫含量从30%到100%不等的用于太阳能电池的硅藻土吸收剂材料。这些硫夹杂物的带隙分别约为1.45 eV和2.0 eV。设计了一种配方,可以在±5%的误差范围内再现结果,并且在所有可测量和可观察到的参数上,硫化后硫化氢压力的影响可以忽略不计。观察到样品中S / Se比的变化与退火时间线性相关。还观察到,在后硫化的非常早期,原始的Cu2(Zn,Ge)Se4(CZGSe)和初级Cu2(Zn,Ge)(S,Se)4(CZGSSe)相都带有硫。样品中约30%的样品共存。 CZGSe相的(112)X射线衍射(XRD)反射逐渐消失,有利于第一个混合CZGSSe相。使用掠入射率-XRD,S / Se比显示为不均匀。实际上,与测量散装材料时相比,顶层的XRD测量导致计算出更高的硫夹杂物。为了确定硫夹杂物对晶体生长和所产生的吸收层的整体质量的影响,进行了顶部扫描电子显微镜(SEM)和交叉SEM测量。随着S / Se比的增加,获得的图像显示出晶体尺寸的减小和层中大量孔的出现。

著录项

  • 来源
    《Thin Solid Films》 |2018年第30期|247-252|共6页
  • 作者单位

    Institute for Material Research (IMO), Hasselt University (partner in Solliance & EnergyVille),Imec division IMOMEC (partner in Solliance & EnergyVille);

    Institute for Material Research (IMO), Hasselt University (partner in Solliance & EnergyVille),Imec division IMOMEC (partner in Solliance & EnergyVille);

    Institute for Material Research (IMO), Hasselt University (partner in Solliance & EnergyVille),Imec division IMOMEC (partner in Solliance & EnergyVille);

    Institute of Applied Physics, Karlsruhe Institute of Technology;

    Institute for Material Research (IMO), Hasselt University (partner in Solliance & EnergyVille),Imec division IMOMEC (partner in Solliance & EnergyVille);

    Institute for Material Research (IMO), Hasselt University (partner in Solliance & EnergyVille),Imec (partner in Solliance & EnergyVille),Department of Electrical Engineering, KU Leuven;

    Institute for Material Research (IMO), Hasselt University (partner in Solliance & EnergyVille),Imec division IMOMEC (partner in Solliance & EnergyVille);

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Kesterite; Absorber material; Precursor annealing; High band gap; Thin film solar cell; Tandem; CZGS;

    机译:钾长石;吸收材料;前体退火;高带隙;薄膜太阳能电池;串联;CZGS;

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