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Thermally activated electrical conductivity of thin films of bis (phthalocyaninato)terbium(Ⅲ) double decker complex

机译:双(酞菁Ⅲ)ter(Ⅲ)双层配合物薄膜的热活化电导率

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摘要

The temperature and field dependence of the electrical conductance of neutral radical bis(phthalocyaninato) terbium(III) (TbPc2) thin films was measured in situ under ultrahigh vacuum. The films behave electrically as narrow gap intrinsic semiconductors, having high conductivity and weakly thermally activated conductance. Taking advantage of the exceptionally high electrical stability of the material and the fast-settling response in the low-field region, precise measurements of the temperature dependence could resolve a linear temperature dependence in the pre-exponential factor of the conduction equation. The activation energy of conductance of the annealed TbPc2 film was determined to be 0.158 eV after adjusting the fitting procedure to take into account the temperature dependent pre-exponential. This new conductance equation, which differs only slightly from the usual Arrhenius expression, arises as the natural consequence of thermal excitation of carriers from a continuous density of deep trap states, or a similar activated process where either the states or the barrier heights distribute over a finite width.
机译:在超高真空下原位测量了中性自由基双(酞菁基)ter(III)(TbPc2)薄膜的电导率的温度和场依赖性。这些膜在电学上像窄间隙本征半导体一样,具有高电导率和弱热激活电导率。利用材料的异常高的电稳定性和在低场区域的快速沉降响应,对温度依赖性的精确测量可以解决传导方程的预指数因子中的线性温度依赖性。在调整拟合程序以考虑到温度相关的指数前,确定退火的TbPc2膜的电导活化能为0.158 eV。这种新的电导方程与通常的Arrhenius表达式仅稍有不同,它是由深陷阱态的连续密度或类似的激活过程(载流子或势垒高度分布在一个或多个)上对载流子进行热激发而自然产生的有限的宽度。

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