机译:表面处理对三甲基铝在硅衬底上生长的Ino.53Gao.47As外延层的影响
Ajou Univ, Dept Energy Syst Res, Dept Phys, Suwon 16499, South Korea;
Ajou Univ, Dept Energy Syst Res, Dept Phys, Suwon 16499, South Korea;
Ajou Univ, Dept Energy Syst Res, Dept Phys, Suwon 16499, South Korea;
Ajou Univ, Dept Energy Syst Res, Dept Phys, Suwon 16499, South Korea;
Ajou Univ, Dept Energy Syst Res, Dept Phys, Suwon 16499, South Korea;
Ajou Univ, Dept Energy Syst Res, Dept Phys, Suwon 16499, South Korea;
Ajou Univ, Dept Energy Syst Res, Dept Phys, Suwon 16499, South Korea;
Hanyang Univ, Dept Mat Sci & Chem Engn, Ansan 15588, South Korea;
Korea Adv Nano Fab Ctr, Suwon 16229, South Korea;
Korea Adv Nano Fab Ctr, Suwon 16229, South Korea;
Korea Adv Nano Fab Ctr, Suwon 16229, South Korea;
Korea Adv Nano Fab Ctr, Suwon 16229, South Korea;
Ajou Univ, Dept Energy Syst Res, Dept Phys, Suwon 16499, South Korea;
Indium gallium arsenide; Epitaxial layer; Silicon; High-k; Dielectric constant; Atomic layer deposition; Trimethylaluminum; Capacitance density;
机译:AIN前生长三甲基铝步骤的持续时间对通过金属有机化学气相沉积在硅衬底上生长的GaN层形态的影响的详细研究
机译:氮掺杂直拉生长硅衬底上外延层的晶体缺陷(Ⅱ)“通过控制晶体生长条件和碳共掺杂抑制外延层中的晶体缺陷”
机译:基于超大结构层和探测硅的柔顺基材上生长的外延GaAs层的结构光谱研究
机译:硅和蓝宝石基材上生长的GaN外延层的镀锌性能比较
机译:基于外延锗层的金属氧化物半导体器件,通过超高真空化学气相沉积直接在硅衬底上选择性生长
机译:在绝缘体上硅衬底上的纳米结构Si岛上外延生长的Ge点的X射线表征
机译:衬底对通过Cat-CVD生长的掺杂薄硅层性能的影响