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Investigation of hydrogen inductively coupled plasma treatment effect for Ge_(0.938)Sn_(0.062)/Ge/Si film using photoreflectance spectroscopy

机译:氢反射耦合等离子体处理Ge_(0.938)Sn_(0.062)/ Ge / Si薄膜的光反射光谱研究

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摘要

Temperature-dependent photoreflectance (PR) measurements for Ge0.938Sn0.062/Ge/Si films treated with a hydrogen inductively coupled plasma (H-2-ICP) have been performed. The Ge0.938Sn0.062 film is grown on Gebuffered Si substrate by ultra-high vacuum chemical vapor deposition method, and the H-2-ICP treatment was carried out for 5 min for the Ge0.938Sn0.062 epitaxial layer. The high-resolution X-ray diffraction results show that the compressive strain of the Ge0.938Sn0.062 layer decreases and the tensile strain of the Ge buffer layer increases after H-2-ICP treatment. The PR spectrum of as-grown Ge0.938Sn0.062/Ge/Si film at 300 K consists of three signals at 0.603, 0.782 and 0.814 eV, which are assigned to the direct transitions from conduction Gamma valley to the valence bands related to the surface of Ge0.938Sn0.062, the Ge/Si and GeSn/Ge interfaces, respectively. After H2-ICP treatment, two PR signals of 0.604 and 0.781 eV were obtained at 300 K and they are attributed to the direct transition energies of the Ge0.938Sn0.062 and the Ge buffer layer, respectively. As temperature decreases, new weak PR signals appear in the lower energy regions of both PR signals from the H-2-ICP treated GeSn and Ge layers at 210 K and 130 K, respectively, due to the increase of tensile strain in Ge layer while no new signal appears for the as-grown sample. The PR spectrum of the H-2-ICP treated sample at 10 K shows four signals, and these signals are assigned to the surface of GeSn and GeSn at the interface between GeSn and Ge buffer layers, the Ge at the interface between GeSn and Ge buffer layers, and the Ge at the interface between Ge buffer layer and Si substrate, respectively. These PR results indicate that H-2-ICP treatment significantly affects the strain and defects near the interface between GeSn and Ge layers, and thus optical properties of GeSn layer are also altered by H-2-ICP treatment.
机译:已经对用氢感应耦合等离子体(H-2-ICP)处理的Ge0.938Sn0.062 / Ge / Si膜进行了随温度变化的光反射(PR)测量。通过超高真空化学气相沉积法在Gebuffered Si衬底上生长Ge0.938Sn0.062薄膜,并对Ge0.938Sn0.062外延层进行H-2-ICP处理5min。高分辨率X射线衍射结果表明,经过H-2-ICP处理后,Ge0.938Sn0.062层的压缩应变降低,Ge缓冲层的拉伸应变增加。生长的Ge0.938Sn0.062 / Ge / Si薄膜在300 K时的PR谱由三个信号分别为0.603、0.782和0.814 eV组成,这些信号被指定为从传导伽马谷到与价带相关的价带的直接跃迁。 Ge0.938Sn0.062的表面,Ge / Si和GeSn / Ge界面。经过H2-ICP处理后,在300 K下获得了两个PR信号0.604和0.781 eV,它们分别归因于Ge0.938Sn0.062和Ge缓冲层的直接跃迁能。随着温度降低,由于Ge层中拉伸应变的增加,经过H-2-ICP处理的GeSn和Ge层的两个PR信号的较低能量区域中分别出现了210 K和130 K处的新的弱PR信号。所生长的样品没有新的信号出现。经H-2-ICP处理的样品在10 K时的PR谱显示四个信号,这些信号在GeSn和Ge缓冲层之间的界面处分配给GeSn和GeSn的表面,在GeSn和Ge之间的界面处分配给Ge缓冲层,以及分别在Ge缓冲层和Si衬底之间的界面处的Ge。这些PR结果表明,H-2-ICP处理显着影响GeSn和Ge层之间的界面附近的应变和缺陷,因此,通过H-2-ICP处理也改变了GeSn层的光学性能。

著录项

  • 来源
    《Thin Solid Films》 |2018年第1期|345-350|共6页
  • 作者单位

    Yeungnam Univ, Dept Phys, Gyeongbuk 712749, South Korea;

    Yeungnam Univ, Dept Phys, Gyeongbuk 712749, South Korea;

    Kangwon Natl Univ, Dept Phys, Kangwon Do 200701, South Korea;

    Air Force Inst Technol, Dept Engn Phys, Wright Patterson AFB, OH 45433 USA;

    Arizona State Univ, Dept Chem & Biochem, Tempe, AZ 85287 USA;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Germanium tin; Strain; Photoreflectance;

    机译:锗锡;应变;光反射;
  • 入库时间 2022-08-17 13:35:01

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