机译:包装应用中物理气相沉积铝涂层厚度确定方法的比较
Tech Univ Munich, TUM Sch Life Sci, Chair Food Packaging Technol, Weihenstephaner Steig 22, D-85354 Freising Weihenstephan, Germany;
Fraunhofer Inst Proc Engn & Packaging IVV, Giggenhauser Str 35, D-85354 Freising Weihenstephan, Germany;
Tech Univ Munich, TUM Sch Life Sci, Chair Food Packaging Technol, Weihenstephaner Steig 22, D-85354 Freising Weihenstephan, Germany;
Fraunhofer Inst Proc Engn & Packaging IVV, Giggenhauser Str 35, D-85354 Freising Weihenstephan, Germany;
Tech Univ Munich, TUM Sch Life Sci, Chair Food Packaging Technol, Weihenstephaner Steig 22, D-85354 Freising Weihenstephan, Germany;
Thin film; Quartz crystal micro balance; Atomic force microscopy; Interference; Optical density; Electrical resistivity;
机译:勘误表:Lindner,M.和Schmid,M.包装应用中物理气相沉积铝涂层的厚度测量方法:综述。涂料2017,7,9
机译:包装中物理气相沉积铝涂层的厚度测量方法:综述
机译:包装中物理气相沉积铝涂层的厚度测量方法:综述
机译:保形涂层厚度的确定:方法的比较
机译:调制脉冲功率磁控溅射沉积氮化钛和氮化铝钛涂层的摩擦学和结构性能
机译:原子层沉积的TiO2和Al2O3薄膜作为铝食品包装用涂料
机译:错误:Lindner,M。和施密,M。用于包装应用中的物理气相沉积铝涂层的厚度测量方法:综述。涂料2017,7,9
机译:用于聚合物的反应性沉积氧化铝和含氟聚合物填充氧化铝保护涂层