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SMT step by step Step 8: Test/Inspection

机译:逐步进行SMT步骤8:测试/检查

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摘要

The types of defects found on a modern PCB are broad. To understand the defect spectrum for different products against the potential to introduce defects across different manufacturing lines is very complex. There have been many changes in defects and inspection techniques over the past 15 years with many more expected. New assembly technologies such as lead-free solder will change the fault spectrum and possibly the defect types that must be detected. Increasing PCB data and clock speeds will reduce ICT bed-of-nails access and require increasing use of different and complementary inspection strategies such as AOI and AXI.
机译:现代PCB上发现的缺陷种类繁多。要了解不同产品的缺陷范围,以防跨不同生产线引入缺陷的可能性非常复杂。在过去的15年中,缺陷和检查技术发生了许多变化,并且预计还会有更多变化。新的组装技术(例如无铅焊料)将改变故障范围,并可能改变必须检测的缺陷类型。增加的PCB数据和时钟速度将减少ICT的钉子访问,并需要增加使用诸如AOI和AXI之类的不同且互补的检查策略。

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