X-ray microscope

摘要

The VersaXRM-500 produces two-stage magnification, enabling the user to select magnification by changing objectives or by changing the geometric magnification. It offers non-destructive submicron resolution tomographic capability to visualize buried features without de-packaging, cutting, or otherwise destroying the device. It also provides view into deeply buried microstructures that maybe unobservable with 2D surface imaging, such as optical microscopy, SEM, and AFM. It supports high resolution at large working distances suitable for in situ study using environmental chambers or load cells, and 4D (over time) or under varying environmental conditions.