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首页> 外文期刊>Solid state ionics >Preparation, characterization and intercalation of ternary chalcogenides with layered composite crystal structures formed in the Bi-Ta-S and Bi-Ta-Se systems
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Preparation, characterization and intercalation of ternary chalcogenides with layered composite crystal structures formed in the Bi-Ta-S and Bi-Ta-Se systems

机译:在Bi-Ta-S和Bi-Ta-Se系统中形成的具有层状复合晶体结构的三族硫族化物的制备,表征和嵌入

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摘要

Two kinds of chalcogenides with layered composite crystal structures have been formed in Bi-Ta-S and Bi-Ta-Se systems depending on the preparation conditions: (BiS)_(1.08)TaS_2 and (BiS)_(1.08)(TaS_2)_2 for the former system and (BiSe)_(1.09)TaSe_2 and a new selenide (BiSe)_(1.09)(TaSe_2)_2 for the latter. The new chalcogenide has been characterized by powder X-ray diffraction and electron diffraction. The atomic coordinates in the layer-stacking direction of the new chalcogenide and its hydrazine intercalation compound have been determined. The electrical resistivity measurement has suggested that all of these chalcogenides are low temperature superconductors.
机译:根据制备条件,在Bi-Ta-S和Bi-Ta-Se系统中形成了两种具有层状复合晶体结构的硫属元素化物:(BiS)_(1.08)TaS_2和(BiS)_(1.08)(TaS_2)前者系统为_2,(BiSe)_(1.09)TaSe_2和后者为新硒化物(BiSe)_(1.09)(TaSe_2)_2。新型硫族化物的特征在于粉末X射线衍射和电子衍射。确定了新硫属化物及其肼插层化合物在层积方向上的原子坐标。电阻率测量表明所有这些硫族化物都是低温超导体。

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