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Rectifying properties of solid C_60-GaN, C_70-GaN and C_70/p-GaN heterojunctions

机译:固态C_60 / n-GaN,C_70 / n-GaN和C_70 / p-GaN异质结的整流特性

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Current-voltage measurements show that C_60-GaN, C_70-GaN and C_70/p-GaN contacts have very good rectification characteristics, however, the polarities of the forward biases for C_60-GaN (C_70-GaN) and C_70/p- GaN are opposite to each other. By fitting forward current-voltage data, the relations of both the series resistance and ideality factor vs forward bias for C_60-GaN and C_70-GaN have been obtained. Thermal activation measurements at a fixed forward bias reveal exponential relations of currents vs the reciprocal of temperature. The effective barrier heights for C_6o-GaN and C_70-GaN are determined to be 0.535 and 0.431 eV, respectively.
机译:电流电压测量表明C_60 / n-GaN,C_70 / n-GaN和C_70 / p-GaN触点具有非常好的整流特性,但是C_60 / n-GaN(C_70 / n-GaN的正向偏压的极性)和C_70 / p-GaN彼此相反。通过拟合正向电流-电压数据,获得了C_60 / n-GaN和C_70 / n-GaN的串联电阻和理想因子与正向偏置的关系。在固定的正向偏置下进行的热活化测量揭示了电流与温度倒数的指数关系。 C_6o / n-GaN和C_70 / n-GaN的有效势垒高度分别确定为0.535和0.431 eV。

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