...
首页> 外文期刊>Solid-State Electronics >Thermal annealing effects on stimulated emission of high-indium-content InGaN/GaN single quantum well structure
【24h】

Thermal annealing effects on stimulated emission of high-indium-content InGaN/GaN single quantum well structure

机译:热退火对高铟含量InGaN / GaN单量子阱结构的受激发射的影响

获取原文
获取原文并翻译 | 示例
           

摘要

The optical pumping spectra of InGaN/GaN single quantum well structures with high indium content after thermal annealing were analyzed at room temperature. Redshift of the peak position in the optical pumping spectra was ob- seved after the samples were annealed for 0.5 h at 700 deg. C. However, blueshift of the peak position was shown after the samples were annealed for 1 and for 2 h. Three mechanisms of band structure deformation duet to the thermal treat- ments have been proposed. The redshift of the peaks might be due to the reduction of the inhomogeneity of the indium content in quantum well. The blueshift of the peaks might originate from the strain relaxation resulting in the reduction of the piezoelectric field or/and the interfacial interdiffusion of In and Ga atoms between the well and barrier.
机译:在室温下分析了具有高铟含量的InGaN / GaN单量子阱结构的光泵浦光谱,该结构具有高铟含量。将样品在700度下退火0.5小时后,观察到光泵浦光谱中峰位置的红移。 C.但是,样品退火1小时和2小时后,峰位置出现了蓝移。已经提出了三种由于热处理引起的带结构变形的机理。峰的红移可能是由于量子阱中铟含量的不均匀性降低所致。峰的蓝移可能源自应变松弛,从而导致压电场减小和/或阱和势垒之间In和Ga原子的界面相互扩散。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号