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Current-voltage characteristics of GaSb homojunctions prepared by MOVPE

机译:MOVPE制备的GaSb同质结的电流-电压特性

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Mechanism of charge transport through GaSb p-n homojunctions prepared by low pressure metal organic vapour phase epitaxy technology was studied. Calculation of current-voltage characteristics based on Shockley-Read-Hall recombination model was performed accounting for specific features of the band structure of GaSb with the lowest minimum of the conduction band at Γ point and higher minima at L points. It is shown that this type of transport prevails if the samples were prepared at higher growth rate. Analysis of temperature dependencies of some parameters of the experimental characteristics gave, besides the expected value of band gap energy, also the activation energy of the recombination level as (E_c ― 0.22) eV or (E_v ― 0.29) eV. The latter value agrees reasonably well with published data on deep levels in GaSb. On the other hand, the charge transport in more slowly grown samples was nearly temperature independent, especially in the reverse direction, probably due to prevailing tunnelling mechanism.
机译:研究了通过低压金属有机气相外延技术制备的GaSb p-n同质结的电荷传输机理。考虑到GaSb的能带结构的特定特征,其中在Γ点的导带最小值最小,而在L点的最小值更高,因此基于Shockley-Read-Hall重组模型进行了电流-电压特性的计算。结果表明,如果样品以较高的增长率制备,这种运输方式将占上风。分析了实验特性的一些参数对温度的依赖性,除带隙能量的期望值外,还给出了复合能级的活化能为(E_c〜0.22)eV或(E_v〜0.29)eV。后者的值与有关GaSb深层的公开数据相当吻合。另一方面,生长较慢的样品中的电荷传输几乎与温度无关,尤其是在相反方向,这可能是由于主要的隧穿机理所致。

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