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Detection of hidden structures in a photoexcited semiconductor via principal-component analysis

机译:通过主成分分析检测光激发半导体中的隐藏结构

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摘要

We study the transport properties of a GaAs-based semiconductor under local optical excitation via direct numerical simulation. The simulation results propose a hypothesis which describes the possibility to control the high-field domain in terms of tunable modulations of the doping profile and the length of the notch region. This hypothesis can be verified, both quantitative and qualitative agreement, via principal-component analysis. Besides, higher harmonic modes embedded in the high-field domain also can be automatically extracted from principal-component analysis. This study might be useful to identify the "effective" length and shape of the cathode notch and to restore the doping concentration in semiconductor devices.
机译:我们通过直接数值模拟研究了在局部光激发下基于GaAs的半导体的传输特性。仿真结果提出了一个假设,该假设描述了根据掺杂分布和陷波区长度的可调调制来控制高场域的可能性。通过主成分分析,可以在数量和质量上验证该假设。此外,还可以从主成分分析中自动提取嵌入高场域的高次谐波模式。这项研究对于确定阴极缺口的“有效”长度和形状以及恢复半导体器件中的掺杂浓度可能是有用的。

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