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Meyer-Neldel rule in Se and S-doped hydrogenated amorphous silicon

机译:硒和硫掺杂的氢化非晶硅中的Meyer-Neldel规则

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The electrical conductivity of a-Si,Se:H and a-Si,S:H films prepared by plasma enhanced chemical vapour deposition on corning 7059 glass. The conductivity measured in the temperature range of 300-470 K was analyzed to exhibit two different transport mechanisms. In the high temperature range (370-470 K), the conduction was found to be of activated type while at low temperature (less than 370 K), it was observed to follow variable range hopping. The experimental results have also been analyzed using Meyer-Neldel Rule. A consequence of the Meyer-Neldel rule is the occurrence of the characteristic energy E_(MN)( = kT_(MN)) for Se and S-doped a-Si:H films 54 meV and 50 meV, respectively. This corresponds to characteristic temperature of 616 and 591 K where the conductivity data becomes independent of dopant concentrations.
机译:通过等离子增强康宁7059玻璃上的化学气相沉积制备的a-Si,Se:H和a-Si,S:H薄膜的电导率。分析了在300-470 K温度范围内测得的电导率,显示出两种不同的传输机理。在高温范围(370-470 K)中,发现传导是激活型的,而在低温(小于370 K)中,发现传导遵循可变范围跳变。还使用Meyer-Neldel规则分析了实验结果。 Meyer-Neldel规则的结果是分别出现了Se和S掺杂的a-Si:H薄膜54 meV和50 meV的特征能量E_(MN)(= kT_(MN))。这对应于616和591 K的特征温度,其中电导率数据变得与掺杂剂浓度无关。

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