Corrigendum To 'an Analytical Channel Thermal Noise Model For Deep Sub-micron Mosfets With Short Channel Effects' [solid State Electronics 51(7) (2007) 1034-1038]

摘要

With respect to our paper published in the July, 2007 issue of this journal, "An Analytical Channel Thermal Noise Model for Deep Sub-micron MOSFETs with Short Channel Effects" [1], there were several misprints and miscalculation found, which we would like to correct and apologize to readers for this journal.