机译:新型测试系统在低温条件下表征单事件效应的应用
Department of Electrical Engineering and Computer Science. Vanderbilt University, Nashville TN, USA;
Department of Electrical Engineering and Computer Science. Vanderbilt University, Nashville TN, USA;
Department of Electrical Engineering and Computer Science. Vanderbilt University, Nashville TN, USA;
Broadcom Corp., Irvine, CA, USA;
Department of Electrical Engineering and Computer Science. Vanderbilt University, Nashville TN, USA Institute for Space and Defense Electronics (ISDE), Vanderbilt University, Nashville TN, USA;
Department of Electrical Engineering and Computer Science. Vanderbilt University, Nashville TN, USA Institute for Space and Defense Electronics (ISDE), Vanderbilt University, Nashville TN, USA;
Department of Electrical Engineering and Computer Science. Vanderbilt University, Nashville TN, USA Institute for Space and Defense Electronics (ISDE), Vanderbilt University, Nashville TN, USA;
Department of Electrical Engineering and Computer Science. Vanderbilt University, Nashville TN, USA Institute for Space and Defense Electronics (ISDE), Vanderbilt University, Nashville TN, USA;
Department of Electrical Engineering and Computer Science. Vanderbilt University, Nashville TN, USA Institute for Space and Defense Electronics (ISDE), Vanderbilt University, Nashville TN, USA;
IR Labs Inc. Tucson, AZ, USA;
cryogenic testing; single-event effects; single-event transient; pulse width; CMOS 130 nm;
机译:用于单事件效应测试的表征中子场的探测器设计
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机译:低温和低温下材料机械测试中准动态过程参数配准的自动测量系统
机译:新型测试系统在低温下表征单事件瞬态的应用
机译:在低温下测试和表征硅器件。
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