机译:速度饱和和热载流子效应对深亚微米MOSFET沟道热噪声模型的影响
VIRTUS, IC Design Centre of Excellence, School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Block S3.2, Level B2, Singapore 639798, Singapore,CLOBALFOUNDRIES Singapore Pte. Ltd., 60 Woodlands Industrial Park D Street 2, Singapore 738406, Singapore;
VIRTUS, IC Design Centre of Excellence, School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Block S3.2, Level B2, Singapore 639798, Singapore;
VIRTUS, IC Design Centre of Excellence, School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Block S3.2, Level B2, Singapore 639798, Singapore,CLOBALFOUNDRIES Singapore Pte. Ltd., 60 Woodlands Industrial Park D Street 2, Singapore 738406, Singapore;
VIRTUS, IC Design Centre of Excellence, School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Block S3.2, Level B2, Singapore 639798, Singapore;
VIRTUS, IC Design Centre of Excellence, School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Block S3.2, Level B2, Singapore 639798, Singapore,CLOBALFOUNDRIES Singapore Pte. Ltd., 60 Woodlands Industrial Park D Street 2, Singapore 738406, Singapore;
VIRTUS, IC Design Centre of Excellence, School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Block S3.2, Level B2, Singapore 639798, Singapore;
VIRTUS, IC Design Centre of Excellence, School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Block S3.2, Level B2, Singapore 639798, Singapore;
channel thermal noise; high frequency noise modeling; hot carrier effect; MOSFET; velocity saturation effect;
机译:“具有短通道效应的深亚微米Mosfets的分析通道热噪声模型”的更正[固态电子技术51(7)(2007)1034-1038]
机译:具有短沟道效应的深亚微米MOSFET的分析沟道热噪声模型
机译:超深亚微米pMOSFET中的热载流子退化和新的寿命预测模型
机译:深亚微米MOSFET中的分析高频通道热噪声建模
机译:SLAPSHOT:一种面向工程的蒙特卡洛工具,用于在深亚微米MOSFET中进行热载流子研究。
机译:面向低电压低能耗的超薄绝缘体上硅MOSFET低频噪声行为的经验和理论模型
机译:对深亚微米FD-SOI MOSFET热噪声的自热响应