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机译:短沟道p型和n型无结纳米线晶体管的低频噪声和有效陷阱密度
Department of Electrical Engineering, Centra Universitario da FE1, Av. Humberto de Alencar Castelo Branco, 3972, CEP 09850-901 Sao Bernardo do Campo, Brazil;
Department of Electrical Engineering, Centra Universitario da FE1, Av. Humberto de Alencar Castelo Branco, 3972, CEP 09850-901 Sao Bernardo do Campo, Brazil;
Department of Electrical Engineering, Centra Universitario da FE1, Av. Humberto de Alencar Castelo Branco, 3972, CEP 09850-901 Sao Bernardo do Campo, Brazil;
Department of Electrical Engineering, Centra Universitario da FE1, Av. Humberto de Alencar Castelo Branco, 3972, CEP 09850-901 Sao Bernardo do Campo, Brazil;
Junctionless nanowire transistors; Low-frequency noise; Effective trap density;
机译:通过低频噪声表征分析衬底偏置对无结纳米线晶体管中界面俘获电荷的影响
机译:通过无结晶体管中的低频噪声表征阱密度
机译:不同局部捕集电荷曲线对短通道双栅极连接纳米线晶体管逆变器和环形振荡电路的影响
机译:nMOS和pMOS短通道无结纳米线晶体管的低频噪声
机译:微观研究有机半导体中电荷的命运:扫描开尔文探针测量p型和n型器件中的电荷俘获,传输和电场
机译:金属辅助化学法制备硅纳米线的研究在n型c-Si中作为光阱材料蚀刻太阳能电池
机译:陷阱和缺陷对Ge沟道无结构纳米线晶体管高温性能的影响