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首页> 外文期刊>Solid-State Electronics >A comparative study of lateral SiCN/porous silicon and verticaln SiCN/porous silicon junctions for sensing ultraviolet light
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A comparative study of lateral SiCN/porous silicon and verticaln SiCN/porous silicon junctions for sensing ultraviolet light

机译:侧向SiCN /多孔硅和垂直SiCN /多孔硅结用于感测紫外光的比较研究

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摘要

In this paper, we report the comparative study of both lateral n-SiCN/p-porous silicon (PS) and vertical n-SiCN/p-porous silicon (PS) heterojunctions for low cost and high temperature ultraviolet (UV) detecting applications. The cubic crystalline n-SiCN films were deposited on p-(100) PS substrate with rapid thermal chemical vapor deposition (RTCVD). Owing to the PS layer features high resistivity and the flexibility, thus suppress the dark current to obtain a high photocurrent/dark current rati
机译:在本文中,我们报告了用于低成本和高温紫外线(UV)检测应用的横向n-SiCN / p多孔硅(PS)和垂直n-SiCN / p多孔硅(PS)异质结的比较研究。立方晶体n-SiCN薄膜通过快速热化学气相沉积(RTCVD)沉积在p-(100)PS衬底上。由于PS层具有高电阻率和柔韧性,因此可以抑制暗电流以获得高光电流/暗电流比率

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