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机译:考虑栅极下方势垒层中受体样陷阱的AlGaN / GaN HEMT跨导非线性研究
Univ Elect Sci & Technol China, Sch Microelect & Solid State Elect, Chengdu 610054, Peoples R China|Univ Sheffield, Dept Elect & Elect Engn, Sheffield S1 3JD, S Yorkshire, England;
Univ Elect Sci & Technol China, Sch Microelect & Solid State Elect, Chengdu 610054, Peoples R China;
Univ Elect Sci & Technol China, Sch Microelect & Solid State Elect, Chengdu 610054, Peoples R China;
Univ Elect Sci & Technol China, Sch Microelect & Solid State Elect, Chengdu 610054, Peoples R China;
Univ Elect Sci & Technol China, Sch Microelect & Solid State Elect, Chengdu 610054, Peoples R China;
Univ Elect Sci & Technol China, Sch Microelect & Solid State Elect, Chengdu 610054, Peoples R China;
Univ Elect Sci & Technol China, Sch Microelect & Solid State Elect, Chengdu 610054, Peoples R China;
AlGaN/GaN HEMT; Transconductance; Linearity; Acceptor-like trap; Barrier layer;
机译:p-GaN栅极AlGaN / GaN HEMT中无意识掺杂的GaN缓冲层中的陷阱引起的负跨导效应
机译:界面受体陷阱对AlGaN / GaN HEMT瞬态响应的影响
机译:具有原位Si_3N_4 / Al_2O_3双层栅极电介质的AlGaN / GaN MIS-HEMT上正栅极偏置后的缓慢去陷阱现象分析
机译:GaN功率HEMT中的ALD-AL_2O_3 / ALANG界面陷阱与多种氟化栅极介电层的影响栅极阈值摇摆的效果
机译:研究常关模式的AlGaN / GaN MOS HEMT器件,该器件利用栅极后退和p-GaN栅极结构以及带有醛生长的高k栅极绝缘体来实现高功率应用。
机译:薄Algan屏障PT-AlGaN / GaN HEMT气体传感器的响应增强在高温下源连接栅极配置
机译:用于GaN / AlGaN / GaN MOS HEMT的低温原子层沉积生长的Al2O3栅极电介质:沉积条件对界面态密度的影响