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Realization of Silicon nanotube tunneling FET on junctionless structure using single and multiple gate workfunction

机译:利用单栅极和多栅极功函数在无结结构上实现硅纳米管隧穿FET

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摘要

In this paper, we demonstrate the operation of a Silicon Nanotube Tunneling FET on junctionless structure using 3D numerical simulations. P-I-N band structure thereby the tunneling operation is achieved by placing side gates and applying appropriate side gate biases. Single work function, with the same main and side gates workfunctions and multiple workfunction, with different main and side gates workfunctions are explored to achieve Tunneling FET. ON current, OFF current, Sub-threshold swing, Threshold voltage, trans-conductance and unity gain frequency are extracted for both single and multiple gate workfunctions based devices and compared with the conventional Silicon nanotube tunnel FET. For the same OFF current, the proposed devices show better performance with respect to ON current and subthreshold swing compared to the conventional Silicon nano tube tunnel FET. (C) 2016 Elsevier Ltd. All rights reserved.
机译:在本文中,我们使用3D数值模拟演示了无结结构上的硅纳米管隧穿FET的操作。通过设置侧栅并施加适当的侧栅偏压,可以实现P-I-N带结构,从而实现隧穿操作。为了实现隧穿场效应管,研究了具有相同主栅极和侧栅极功函数的单一功函数以及具有不同主栅极和侧栅极功函数的多个功函数。对于基于单栅极和多栅极功函数的器件,都提取了导通电流,截止电流,亚阈值摆幅,阈值电压,跨导和单位增益频率,并与传统的硅纳米管隧道FET进行了比较。对于相同的截止电流,与常规的硅纳米管隧道FET相比,所提出的器件在导通电流和亚阈值摆幅方面表现出更好的性能。 (C)2016 Elsevier Ltd.保留所有权利。

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