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Mobility of interstitial oxygen in scandium by anelastic spectroscopy

机译:弹性光谱法测定scan中的间隙氧迁移率

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The high-temperature anelastic spectrum of the solid solution Sc-O has been investigated on a polycrystalline sample at oxygen concentrations between 0.024 and ~0.9 at.% O, as estimated by residual resistivity and intentional O doping. Two thermally activated relaxation processes appear near 430 and 520 K for a vibration frequency of 3.5 kHz; both peaks are stable with thermal cycling and their intensities increase with the oxygen content, indicating that they are due to O jumps. The process at lower temperature has an intensity that strongly increases with increasing temperature, when measured at higher frequency (42 kHz), indicating that the relaxation occurs between states differing in energy by ~0.3 eV. The peak is describable by a single relaxation time, and is interpreted as due to the stress-induced hopping of single oxygen atoms between the non-equivalent tetrahedral and octahedral interstitial sites. The process at high temperature is tentatively attributed to O pairs. An estimate of the specific resistivity of O atoms has been provided.
机译:通过残余电阻率和有意的O掺杂估计,在氧浓度介于0.024和〜0.9 at。%O之间的多晶样品上研究了固溶体Sc-O的高温非弹性光谱。对于3.5 kHz的振动频率,在430和520 K附近出现了两个热激活的松弛过程。两个峰在热循环中都是稳定的,并且其强度随氧含量的增加而增加,表明它们是由于O跃迁所致。在较高的频率(42 kHz)下测量时,较低温度下的过程具有随温度升高而强烈增加的强度,这表明在能量相差约0.3 eV的状态之间会出现松弛。该峰可通过单个弛豫时间来描述,并解释为由于应力诱导的非等价四面体和八面体间隙位置之间单个氧原子的跳跃。高温下的过程暂定归因于O对。已经提供了O原子的比电阻的估计。

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