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Synthesis and magnetic properties of Zn_(1-x)Mn_xO films prepared by the sol-gel method

机译:溶胶-凝胶法制备Zn_(1-x)Mn_xO薄膜的合成及磁性

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We report on the ferromagnetic characteristics of Zn_(1-x)Mn_xO films (x = 0.1-0.3) prepared by the sol-gel method on silicon substrates using transmission electron microscopy (TEM), energy dispersive spectroscopy (EDS), X-ray diffractometry (XRD) and superconducting quantum interference device (SQUID) magnetometry at various temperatures. Magnetic measurement show that the Curie temperature (T_C) and the coercive field (H_C) were ~39 K and ~2100 Oe for the film of x = 0.2, respectively. EDS and TEM measurements indicate that Mn content at the interface is significantly higher than that at the center of the Zn_(0.8)Mn_(0.2)O film showing the ratio, Zn:Mn:O ≌ 1:12:15. This experimental evidence suggests that ferromagnetic precipitates containing manganese oxide may be responsible for the observed ferromagnetic behavior of the film. Keywrods A. ZnO; A. diluted magnetic semiconductor; A. manganese oxide; B. sol-gel; C. energy dispersive spectroscopy
机译:我们报告了使用透射电子显微镜(TEM),能量色散谱(EDS),X射线通过溶胶凝胶法在硅衬底上制备的Zn_(1-x)Mn_xO薄膜(x = 0.1-0.3)的铁磁特性衍射法(XRD)和超导量子干涉仪(SQUID)磁法在各种温度下的表现。磁测量表明,对于x = 0.2的薄膜,居里温度(T_C)和矫顽场(H_C)分别为〜39 K和〜2100 Oe。 EDS和TEM测量表明,界面处的Mn含量显着高于Zn_(0.8)Mn_(0.2)O膜中心的Mn含量,显示Zn:Mn:O≌1:12:15的比例。该实验证据表明,含有氧化锰的铁磁沉淀可能是所观察到的薄膜铁磁行为的原因。关键A.ZnO; A.稀释的磁性半导体; A.氧化锰;溶胶凝胶; C.能量色散光谱

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