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Metal-insulator transition induced by the magnetic field in n-type GaSb

机译:n型GaSb中磁场感应的金属-绝缘体跃迁

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The metal-insulator (MI) transition induced by a magnetic field was evidenced for the first time in compensated n-type GaSb layers grown by molecular beam epitaxy. The free electron densities were in the low 10~(16) cm~(-3) range or even slightly lower, so that the zero-field 3D electron gas was degenerate and, at the B_(MI) magnetic field of the MI transition, it populates only the spin-split 0~((+)) Landau level (extreme quantum limit). On the metallic side of the MI transition a T~(1/3) dependence of the conductivity was assumed to fit the low-rdata and to estimate the B_(MI) value, which resulted of 9.1 T in the purest sample. The MI transition manifests in a strong increase of the diagonal resistivity with the magnetic field, but not of the Hall coefficient, suggesting that the apparent electron density is practically constant, whereas the mobility varies strongly. The evidence of a maximum in the temperature dependence of the Hall coefficient has been explained through a two channels transport mechanism involving localized and extended states.
机译:在分子束外延生长的补偿n型GaSb层中,首次证明了由磁场引起的金属-绝缘体(MI)过渡。自由电子密度在10〜(16)cm〜(-3)的低范围内或什至略低,因此零场3D电子气退化,并在MI跃迁的B_(MI)磁场下,它仅填充自旋分裂的0〜((+))Landau能级(极限量子极限)。在MI过渡的金属方面,假定电导率的T〜(1/3)依赖性适合低rdata并估计B_(MI)值,这在最纯的样品中为9.1T。 MI跃迁表现为对角线电阻率随磁场而强烈增加,但与霍尔系数无关,表明表观电子密度实际上是恒定的,而迁移率却变化很大。霍尔系数对温度的依赖性最大的证据已通过涉及局部和扩展状态的两个通道传输机制进行了解释。

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