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The effect of series resistance on capacitance-voltage characteristics of Schottky barrier diodes

机译:串联电阻对肖特基势垒二极管电容-电压特性的影响

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The capacitance-voltage (C—V) and current-voltage (I—V) characteristics of the Ti/p-Si Schottky barrier diodes (SBDs) have been investigated taking into account the effect of the interface states and series resistance of the device. The forward C-V measurements have been carried out in the range frequency of 0.3-2 MHz (at six different frequencies). It is seen that the forward C-V plots exhibit anomalous peaks in the presence of a series resistance. It has been experimentally determined that the peak positions in the C-V plot shift towards lower voltages and the peak value of the capacitance decreases with increasing frequency. In addition to, the effect of series resistance on the capacitance is found appreciable at higher frequencies due to the capacitance decreases with increasing frequency.
机译:考虑到界面状态和器件串联电阻的影响,已经研究了Ti / p-Si肖特基势垒二极管(SBD)的电容-电压(CV)和电流-电压(IV)特性。 。正向C-V测量已在0.3-2 MHz的范围频率(在六个不同的频率下)进行。可以看出,在存在串联电阻的情况下,正向C-V图显示出异常峰。实验已经确定,C-V图中的峰值位置朝着较低的电压移动,并且电容的峰值随频率的增加而减小。此外,由于电容随频率增加而减小,因此在较高的频率下发现串联电阻对电容的影响是明显的。

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