首页> 外文期刊>IEEE Journal of Solid-State Circuits >A 10b/12b 40 kS/s SAR ADC With Data-Driven Noise Reduction Achieving up to 10.1b ENOB at 2.2 fJ/Conversion-Step
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A 10b/12b 40 kS/s SAR ADC With Data-Driven Noise Reduction Achieving up to 10.1b ENOB at 2.2 fJ/Conversion-Step

机译:具有数据驱动降噪功能的10b / 12b 40 kS / s SAR ADC,在2.2 fJ /转换步长下可实现高达10.1b ENOB

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摘要

This paper presents a power-efficient 10/12 bit 40 kS/s SAR ADC for sensor applications. It supports resolutions of 10 and 12 bit and sample rates from DC up to 40 kS/s to accommodate a variety of sensor applications. A Data-Driven Noise-Reduction method is introduced to selectively enhance the comparator noise performance. In this way, a higher ADC resolution can be achieved with a small increase of the power consumption. A self-oscillating comparator is used to generate the bit-cycling clock internally. In this way, the ADC only requires an external clock at the sample-rate frequency. A segmented capacitive DAC with 250 aF unit elements is applied to save power and to reduce DNL errors at the same time. The implemented prototype in 65 nm CMOS occupies an area of 0.076 mm$^2$. For the two supported resolutions (10/12 bit), the ADC achieves an ENOB of 9.4 and 10.1 bit while consuming 72 and 97 nW from a 0.6 V supply at 40 kS/s. This leads to power efficiencies of 2.7 and 2.2 fJ/conversion-step for 10 bit and 12 bit resolution, respectively. Furthermore, the leakage power, which is below 0.4 nW, ensures that the efficiency can be maintained down to very low sample rates.
机译:本文提出了一种用于传感器应用的高能效10/12位40 kS / s SAR ADC。它支持10位和12位的分辨率以及从DC到40 kS / s的采样率,以适应各种传感器应用。引入了一种数据驱动的降噪方法,以选择性地提高比较器的噪声性能。这样,可以在功耗增加很小的情况下获得更高的ADC分辨率。自激比较器用于内部产生位循环时钟。这样,ADC仅需要一个采样率频率的外部时钟。采用具有250 aF单位元件的分段电容DAC可以节省功率并同时减少DNL误差。在65 nm CMOS中实现的原型占用0.076 mm 2的面积。对于两种受支持的分辨率(10/12位),ADC的ENOB分别为9.4和10.1位,而以40 kS / s的速度从0.6 V电源消耗的功耗为72和97 nW。对于10位和12位分辨率,这导致功率效率分别为2.7和2.2 fJ /转换步长。此外,低于0.4 nW的泄漏功率可确保将效率保持在非常低的采样率。

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