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Characterisation of SnSe thin films fabricated by chemical molecular beam deposition for use in thin film solar cells

机译:通过化学分子束沉积制造的用于薄膜太阳能电池的SnSe薄膜的特性

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摘要

SnSe thin films were fabricated the first time by chemical molecular beam deposition (CMBD) in atmospheric pressure hydrogen flow using polycrystalline tin selenium (SnSe) precursors. The morphological and electrical properties of the films were studied as a function of the precursor's composition and the substrate temperature. Experimental data indicate that in the resulting thin films Se enrichment takes place at low substrate temperatures, despite the different compositions of the SnSe precursor during the synthesis. In this case, the grain sizes of the films vary in the range of (8-20) mu m, depending on the substrate temperature. In addition, X-ray diffraction analysis of the samples shows that the films have an orthorhombic crystalline structure. The electrical conductivity of films measured by van der Pauw method varies between 6 and 90 (Omega x cm)(-1). The optical measurements on selected SnSe thin films illustrate that the samples have an optical bandgap of (1.1-1.2) eV and the absorption coefficient of similar to 10(5) cm(-1), which is suitable for thin film solar cells.
机译:使用多晶锡硒(SnSe)前驱体,在大气压氢气流中通过化学分子束沉积(CMBD)首次制造了SnSe薄膜。研究了薄膜的形貌和电学性质与前驱体组成和基材温度的关系。实验数据表明,尽管合成过程中SnSe前体的成分不同,但是在所得的薄膜中Se富集发生在低基板温度下。在这种情况下,膜的晶粒尺寸根据基材温度在(8-20)μm的范围内变化。另外,样品的X射线衍射分析表明该膜具有正交晶的晶体结构。通过van der Pauw方法测量的薄膜电导率在6到90(Ωx cm)(-1)之间变化。对选定的SnSe薄膜的光学测量表明,样品的带隙为(1.1-1.2)eV,吸收系数接近10(5)cm(-1),适用于薄膜太阳能电池。

著录项

  • 来源
    《Solar Energy》 |2018年第1期|834-840|共7页
  • 作者单位

    Uzbek Acad Sci, Phys Tech Inst, Bodomzor Yoli 2B, Tashkent 100084, Uzbekistan;

    Uzbek Acad Sci, Ion Plasma & Laser Technol, Tashkent 100125, Uzbekistan;

    Univ Parma, GP Usberti 7-A, I-43124 Parma, Italy;

    Uzbek Acad Sci, Phys Tech Inst, Bodomzor Yoli 2B, Tashkent 100084, Uzbekistan;

    Uzbek Acad Sci, Phys Tech Inst, Bodomzor Yoli 2B, Tashkent 100084, Uzbekistan;

    Uzbek Acad Sci, Phys Tech Inst, Bodomzor Yoli 2B, Tashkent 100084, Uzbekistan;

    Uzbek Acad Sci, Phys Tech Inst, Bodomzor Yoli 2B, Tashkent 100084, Uzbekistan;

    Univ Verona, Ca Vignal 2 Str Le Grazie 15, I-37134 Verona, Italy;

    Univ Parma, GP Usberti 7-A, I-43124 Parma, Italy;

    Educ Expt Ctr High Technol, Talabalar Shaharchasi 3A, Tashkent 100174, Uzbekistan;

    Uzbek Acad Sci, Phys Tech Inst, Bodomzor Yoli 2B, Tashkent 100084, Uzbekistan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Thin film; SnSe; Chemical molecular beam deposition; Bandgap;

    机译:薄膜;SnSe;化学分子束沉积;带隙;
  • 入库时间 2022-08-18 00:22:51

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