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Model-based testing of embedded systems in hardware in the loop environment

机译:循环环境中硬件中嵌入式系统的基于模型的测试

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摘要

The evolution of software testing technologies has significantly reduced software testing execution times, but the test design and generation are still often implemented with slow manual-oriented methods. Model-based testing (MBT) offers automation to test design and generation, and different MBT solutions are familiar from research, but more effort needs to be done to adopt MBT for industrial use. Hardware in the loop (HIL) is a simulation and testing technique used in the development and testing of embedded systems. HIL is a challenging application field for MBT due to complex and nondeterministic nature of some embedded systems. To tackle this problem, the authors present a novel prototype platform in which online and offline MBT is applied to HIL environment. MBT in general has been introduced for HIL in scientific literature before, but the application of online MBT in HIL is a novel approach. The whole novel MBT in HIL prototype platform along with the used MBT tool, platform architecture and MBT process are presented accompanied by experimental results and analysis of two case studies with an example embedded system under test.
机译:软件测试技术的发展已大大减少了软件测试的执行时间,但是测试设计和生成仍然经常使用面向手动的缓慢方法来实现。基于模型的测试(MBT)为测试设计和生成提供了自动化,并且各种MBT解决方案在研究中是很熟悉的,但是需要付出更多的努力才能将MBT用于工业用途。硬件在环(HIL)是一种用于嵌入式系统开发和测试的仿真和测试技术。由于某些嵌入式系统的复杂性和不确定性,HIL对于MBT而言是一个充满挑战的应用领域。为了解决这个问题,作者提出了一个新颖的原型平台,该平台将在线和离线MBT应用于HIL环境。以前,MBT在科学文献中已被广泛用于HIL,但在线MBT在HIL中的应用是一种新颖的方法。展示了HIL原型平台中的全新MBT,以及所使用的MBT工具,平台架构和MBT过程,并给出了实验结果和两个案例研究的分析,并带有一个受测试的嵌入式系统实例。

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  • 来源
    《Software, IET 》 |2012年第4期| p.364-376| 共13页
  • 作者

    Keranen J.S.; Raty T.D.;

  • 作者单位

    VTT Technical Research Centre of Finland, Finland;

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  • 正文语种 eng
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