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The effect of bath temperature on the electrodeposition of zinc oxide thin films via an acetate medium

机译:浴温对通过乙酸盐介质电沉积氧化锌薄膜的影响

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摘要

The temperature-dependent nucleation and growth mechanism of electrodeposited zinc oxide (ZnO) thin films on fluorine-doped tin-oxide-coated (10-20 Ω cm~(-2)) glass substrates from an acetate solution was studied by using the chronoamperometry technique. The morphological, compositional and structural properties were studied by scanning electron microscopy (SEM), x-ray photoelectron spectroscopy (XPS) and x-ray diffraction techniques. The current transients were analyzed by fitting chronoamperometric data into the Scharifker-Hills nucleation model, which reveals a change in the nucleation and growth mechanism from progressive to intermediate (progressive + instantaneous) to instantaneous with a rise in bath temperature (from 25 ℃ to 75 ℃). The SEM study showed hexagonal grains for the films obtained at 35 ℃. The x-ray diffraction spectra revealed the formation of phase-pure ZnO thin films. The chemical state of the deposit was confirmed by XPS measurements.
机译:利用计时电流法研究了醋酸盐溶液对氟掺杂氧化锡涂覆的(10-20Ωcm〜(-2))玻璃基板上电沉积氧化锌(ZnO)薄膜的温度依赖性成核和生长机理。技术。通过扫描电子显微镜(SEM),X射线光电子能谱(XPS)和X射线衍射技术研究了形态,组成和结构特性。通过将电流安培数据拟合到Scharifker-Hills成核模型中,分析了电流瞬变,结果表明随着浴温的升高(从25℃升高到75),成核和生长机制从渐进到中间(渐进+瞬时)到瞬时的变化。 ℃)。 SEM研究表明,在35℃下获得的薄膜呈六边形晶粒。 X射线衍射光谱揭示了纯相ZnO薄膜的形成。沉积物的化学状态通过XPS测量确认。

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