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Mobility anisotropy of two-dimensional hole gases in (001)GaAs/Al_0.5Ga_0.5As heterostructures and the influence of uniaxial compression

机译:(001)GaAs / Al_0.5Ga_0.5As异质结构中二维空穴气体的迁移各向异性及单轴压缩的影响

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Transport properties of 2D hole gases in (001)GaAs/Al_0.5Ga_0.5As heterostructures in the [110] and [110] directions have been investigated. In-plane uniaxial compression up to 5 kbar was applied in one or the other of the two directions, and measurements were performed in the temperature range l .4--60 K and in a magnetic field up to 6 T. Without uniaxial compression the mobility is largest in the [110] direction, the [ 110]: [110] mobilities ratio attaining its largest values at low temperatures and high carrier densities. Interface roughness scattering together with acoustic phonon scattering is suggested to be the underlying phenomenon. Under uniaxial compression the electrical resistance decreases in the direction parallel to the compression, and it increases in the direction perpendicular to the compression. This behaviour is found to be in qualitative agreement with recent band structure calculations.
机译:研究了(001)GaAs / Al_0.5Ga_0.5As异质结构中二维空穴气体在[110]和[110]方向上的传输特性。在两个方向中的一个方向或另一个方向上施加了最高5 kbar的面内单轴压缩,并且在温度范围为.4--60 K且磁场最高为6 T的条件下进行了测量。迁移率在[110]方向上最大,[110]:[110]迁移率在低温和高载流子密度下达到最大值。界面粗糙度的散射和声子的声子散射被认为是潜在的现象。在单轴压缩下,电阻在平行于压缩的方向上减小,而在垂直于压缩的方向上增大。发现该行为与最近的频带结构计算在质量上一致。

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