INVENTIVE PRODUCTIVITY AND THE SYATISTICS OF EXCEEDANCES

摘要

We show that inventive productivity can be described by two variables, Frequency and Lifetime. For several samples of inventors, we show that the Exponential and Generalized Pareto distribution provide excellent goodness-of-fit to these variables. Furthermore, good fits to these distributions arises naturally from the statistics of exceedances. Thus, a better theoretical foundation and connection to environmental variables is shown for Frequency and Lifetime than has been shown for Lotka's Law.