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Automatic library migration for the generation of hardware-in-the-loop models

机译:自动库迁移以生成硬件在环模型

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摘要

Embedded systems are widely used in several applications nowadays. As they integrate hard- and software elements, their functionality and reliability are often tested by hardware-in-the-loop methods, in which the system under test runs in a simulated environment. Due to the rising complexity of the embedded functions, performance limitations and practicability reasons, the simulations are often specialized to test specific aspects of the embedded system and develop a high diversity by themselves. This diversity is difficult to manage for a user and results in erroneously selected test components and compatibility problems in the test configuration. This paper presents a generative programming approach that handles the diversity of test libraries. Compatibility issues are explicitly evaluated by a new interface concept. Furthermore, a novel model analyzer facilitates the efficient application in practice by migrating existing libraries. The approach is evaluated for an example from the automotive domain using MATLAB/Simulink.
机译:嵌入式系统如今已广泛用于多种应用中。由于它们集成了硬件和软件元素,因此通常通过硬件在环方法来测试其功能和可靠性,其中被测系统在模拟环境中运行。由于嵌入式功能的复杂性不断提高,性能局限性和实用性原因,仿真通常专门用于测试嵌入式系统的特定方面,并自行开发出高度的多样性。对于用户而言,这种多样性很难管理,并且会导致错误选择的测试组件以及测试配置中的兼容性问题。本文提出了一种生成式编程方法,可以处理测试库的多样性。兼容性问题由新的接口概念明确评估。此外,新型模型分析器可通过迁移现有库促进实践中的有效应用。使用MATLAB / Simulink在汽车领域对方法进行了评估。

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